High-Chern-number Quantum anomalous Hall insulators in mixing-stacked MnBi2Te4 thin films

Quantum anomalous Hall (QAH) insulators are characterized by vanishing longitudinal resistance and quantized Hall resistance in the absence of an external magnetic field. Among them, high-Chern-number QAH insulators offer multiple nondissipative current channels, making them crucial for the development of low-power-consumption electronics. Using first-principles calculations, we propose that high-Chern-number (C > 1) QAH insulators can be realized in MnBi₂Te₄ (MBT) multilayer films through the combination of mixed stacking orders, eliminating the need for additional buffer layers. The underlying physical mechanism is validated by calculating real-space-resolved anomalous Hall conductivity (AHC). Local AHC is found to be predominantly located in regions with consecutive correct stacking orders, contributing to quasi-quantized AHC. Conversely, regions with consecutive incorrect stacking contribute minimally to the total AHC, which can be attributed to the varied interlayer coupling in different stacking configurations. Our work provides valuable insights into the design principle for achieving large Chern numbers, and highlights the role of stacking configurations in manipulating electronic and topological properties in MBT films and its derivatives.