{"title":"《不信任:大数据、数据折磨和对科学的攻击》加里·史密斯(英国牛津:牛津大学出版社,2023年,323页)","authors":"A. David Wunsch","doi":"10.1109/MTS.2025.3560368","DOIUrl":null,"url":null,"abstract":"Presents reviews for the following list of books, (Distrust: Big Data, Data Torturing and the Assault on Science).","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"44 2","pages":"48-50"},"PeriodicalIF":1.9000,"publicationDate":"2025-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11018457","citationCount":"0","resultStr":"{\"title\":\"Distrust: Big Data, Data Torturing and the Assault on Science—Gary Smith (Oxford, U.K.: Oxford Univ. Press, 2023, 323 pp.)\",\"authors\":\"A. David Wunsch\",\"doi\":\"10.1109/MTS.2025.3560368\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Presents reviews for the following list of books, (Distrust: Big Data, Data Torturing and the Assault on Science).\",\"PeriodicalId\":55016,\"journal\":{\"name\":\"IEEE Technology and Society Magazine\",\"volume\":\"44 2\",\"pages\":\"48-50\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2025-03-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11018457\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Technology and Society Magazine\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11018457/\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Technology and Society Magazine","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11018457/","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
期刊介绍:
IEEE Technology and Society Magazine invites feature articles (refereed), special articles, and commentaries on topics within the scope of the IEEE Society on Social Implications of Technology, in the broad areas of social implications of electrotechnology, history of electrotechnology, and engineering ethics.