电晕放电电离器消除静电过程中PCB上半导体器件的电应力

IF 1 4区工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEJ Transactions on Electrical and Electronic Engineering Pub Date : 2024-12-04 DOI:10.1002/tee.24245

Aguri Nakano, Makoto Okano, Takashi Terashige

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引用次数: 0

摘要

安装在印刷电路板上的半导体器件可能受到静电消除过程中电晕放电电离器产生的电场产生的感应电压的电应力而损坏，因为连接到半导体器件的输入线充当终止电场的天线。在印刷电路板上安装了一种使用带输入线的运算放大器的电应力传感器，以研究电离器电场引起的电应力对输入线长度的依赖关系。结果表明，在电晕放电电离器静电消除过程中，当输入线长度超过50 mm时，近期缩小的半导体器件可能会受到损坏。©2024日本电气工程师协会和Wiley期刊有限责任公司。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Electrical Stress on Semiconductor Devices Mounted on PCB during Electrostatic Elimination by Corona Discharge Ionizer

Semiconductor devices mounted on printed circuit boards may be damaged by electrical stresses based on induced voltages due to the electric field generated by corona discharge ionizers during the static elimination, because the input line connected to the semiconductor device acts as an antenna terminating the electric field. An electrical stress sensor using an operational amplifier with an input line was mounted on a printed circuit board, in order to investigate the input line length dependence of the electrical stress due to the electric field by the ionizer. The results showed that recent scaled-down semiconductor devices may be damaged when the length of the input line exceeds 50 mm during static elimination with the corona discharge ionizer. © 2024 Institute of Electrical Engineers of Japan and Wiley Periodicals LLC.

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来源期刊

IEEJ Transactions on Electrical and Electronic Engineering 工程技术-工程：电子与电气

CiteScore

2.70

自引率

10.00%

发文量

199

审稿时长

4.3 months

期刊介绍： IEEJ Transactions on Electrical and Electronic Engineering (hereinafter called TEEE ) publishes 6 times per year as an official journal of the Institute of Electrical Engineers of Japan (hereinafter "IEEJ"). This peer-reviewed journal contains original research papers and review articles on the most important and latest technological advances in core areas of Electrical and Electronic Engineering and in related disciplines. The journal also publishes short communications reporting on the results of the latest research activities TEEE ) aims to provide a new forum for IEEJ members in Japan as well as fellow researchers in Electrical and Electronic Engineering from around the world to exchange ideas and research findings.