压控晶体振荡器在直流电压基准验证中的应用。

IF 1.5 Q2 ENGINEERING, MULTIDISCIPLINARY
Engineering Research Express Pub Date : 2025-06-30 Epub Date: 2025-04-08 DOI:10.1088/2631-8695/adc77e
Matthew T Spidell, Gaylon W Partain, Alan G Jaffe, Malcom G White, John H Lehman
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引用次数: 0

摘要

直流参考电压通常基于校准的齐纳二极管,这些二极管容易漂移,因此需要根据初级标准定期重新校准。由于最好保持这种参考的恒定功率,因此这种重新校准所涉及的运输和处理物流可能会带来不可接受的负担。因此,验证是首选,通常通过与其他本地齐纳二极管进行比较来完成。然而,这些齐纳二极管都受到相关老化机制的影响。电压到频率的转换代表了验证的另一种机制,因此,不受老化的影响,与被验证的系统高度相关。电压到频率的转换使用低空间、重量和功率的压控振荡器,通过比较压控频率和主频率,提供了一种识别电压参考漂移的机制,通常可以通过GPS获得。当由于系统部署而无法与主要电压标准进行比较时,该技术可以验证电压参考,并且远离可靠的物流链。电压到频率的转换可以由电压控制的加热晶体振荡器来完成。使用商用现成的硬件,我们构建了一个测试来评估这种振荡器在258天的连续运行时间内的稳定性,没有老化加速措施。长期漂移与t老化模型一致。封存2/3的数据来构建老化模型,然后比较封存的数据,得到35 ppm (35 μV/V)的模型-数据差异,这在6.5位数电压表类的支持仪器中是可以接受的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Application of voltage controlled crystal oscillators to DC voltage reference validation.

DC voltage references are typically based on calibrated Zener Diodes which are subject to drift and therefore require periodic recalibration against a Primary Standard. Since it is preferable to maintain constant power to such references, the shipping and handling logistics involved in such a recalibration can present an unacceptable burden. Validation is therefore preferred, and typically accomplished by comparison against other local Zener Diodes. However, these Zener Diodes are all subject to correlated aging mechanisms. Voltage to frequency conversion represents an alternative mechanism for validation and accordingly, is not subject to aging highly correlated with the system being validated. Voltage to frequency conversion using a low space, weight, and power Voltage Controlled Oscillator offers a mechanism for identifying voltage reference drift by comparing the voltage-controlled frequency to primary frequency, typically available through GPS. This technique can validate voltage references when comparison against a primary voltage standard is impractical due to system deployment, away from a robust logistics chain. Voltage to frequency conversion may be accomplished by a Voltage Controlled Ovenized Crystal Oscillator. Using commercial-off-the-shelf hardware we constructed a test to evaluate the stability of such an oscillator for 258 days of continuous run-time, without age acceleration measures. Long-term drift was consistent with a t aging model. Sequestering 2/3 of the data to construct an aging model, then comparing sequestered data, yielded a model-to-data difference of 35 ppm (35 μV/V) which may prove acceptable in supporting instruments in the 6.5-digit voltmeter class.

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来源期刊
Engineering Research Express
Engineering Research Express Engineering-Engineering (all)
CiteScore
2.20
自引率
5.90%
发文量
192
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