Duc-Tri do;Anh-Tuan Nguyen-Phan;Khai M. Nguyen;Vinh-Thanh Tran
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Fault-Tolerant Methods for Three-Level T-Type Inverter to Balance Neutral-Point Voltage
This paper proposes new fault-tolerant (FT) space-vector modulation (SVM) techniques for three-level T-type inverter (3L-T2I) to balance neutral-point voltage (NPV) under faulty conditions. Unlike conventional FT-SVM methods, which use three-nearest vectors to synthesize output voltages, the proposed SVM methods add one small vector to conventional switching sequences to obtain NPV balance. Dwell-time of extra vectors are maximized to decrease NPV balanced time. Comparing to conventional FT-SVM methods, the proposed approaches can significantly reduce the difference in capacitor voltages. As a result, the amplitudes of DC component and high-order harmonics of output currents are also reduced. Consequently, the quality of output current is improved. Experimental results, which are conducted by a 1.1-kVA laboratory prototype, are presented to verify the effectiveness of the proposed FT methods. Comparison studies based on experimental results are also presented to demonstrate the advantages of NPV balance of the proposed method compared to conventional FT methods.
IEEE AccessCOMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍:
IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest.
IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on:
Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals.
Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering.
Development of new or improved fabrication or manufacturing techniques.
Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.