Phase boundary modulation and dielectric, piezoelectric and ferroelectric properties of PZN-xPZT ternary ceramics

Ternary of PZN-xPZT relaxation ferroelectric ceramics were successfully prepared by conventional solid-phase reaction. With the increase of Pb(Zr, Ti)O₃ (PZT) content, XRD analysis shows a gradual decrease of the inclusion crystal phase and a decrease in the formation of secondary phases such as Zn(NbO₃)₂, leading to a more homogeneous phase structure, which is conducive to the improvement of piezoelectric properties. SEM images and densitometric measurements show a decrease in grain size and an increase in the degree of densification of the ceramics, which contributes to the enhancement of the ability of reorientation of electrical domains and thus the improvement of piezoelectric response. The 0.4PZN-0.6PZT ceramic samples demonstrate favorable grain sizes and exhibit the following optimal properties: T_c = 272 ℃, d₃₃ = 570 pC/N, k_p = 0.67, ε_r = 2175, and tanδ = 1.6%. However, the ceramic sample of 0.45PZN-0.55PZT has better comprehensive properties (T_c = 261 ℃, d₃₃ = 443 pC/N, k_p = 0.59, ε_r = 1908, tanδ = 1.7%, P_r = 37.3 µC/cm², P_s = 30.2 µC/cm², E_c = 1.08 kV/mm). PZN-xPZT ceramics are well known for their excellent dielectric, Curie temperature, phase boundary modulation, piezoelectric and ferroelectric properties and are widely used in sensors and transducers.