Shengkai Guo , Zihe Xu , Xinyan Li , Zhidong Yang , Chenjie Feng , Renmin Han
{"title":"基于l1范数优化的cryo-ET鲁棒投影参数标定","authors":"Shengkai Guo , Zihe Xu , Xinyan Li , Zhidong Yang , Chenjie Feng , Renmin Han","doi":"10.1016/j.ultramic.2025.114134","DOIUrl":null,"url":null,"abstract":"<div><div>Fiducial marker-based alignment in cryo-electron tomography (cryo-ET) has been extensively studied over a long period. The calibration of projection parameters using nonlinear least squares technique methodologies stands as the ultimate and pivotal stage in the alignment procedure. The efficacy of calibration is substantially impacted by noise and outliers in the marker data obtained from previous steps. Several robust fitting methods have been explored and implemented to address this issue by improving marker data or assigning weights to markers. However, these methods have their own limitations and often assume general Gaussian noise assumption, which may not accurately represent the distribution of noise and outliers in the marker data. In this work, we propose a robust projection parameter calibration model based on <span><math><msub><mrow><mi>L</mi></mrow><mrow><mn>1</mn></mrow></msub></math></span>-norm optimization under Laplace noise assumption in order to overcome the limitations of existing methods. To efficiently solve the problem, we also design a faster and stabler first-order non-sparse method based on smooth approximation strategy. Additionally, we introduce subgradient and subdifferential for mathematical analysis. The accuracy, robustness, and efficacy of our approach are demonstrated through both simulated and real-world experiments.</div></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"274 ","pages":"Article 114134"},"PeriodicalIF":2.1000,"publicationDate":"2025-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Robust projection parameter calibration in cryo-ET with L1-norm optimization\",\"authors\":\"Shengkai Guo , Zihe Xu , Xinyan Li , Zhidong Yang , Chenjie Feng , Renmin Han\",\"doi\":\"10.1016/j.ultramic.2025.114134\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Fiducial marker-based alignment in cryo-electron tomography (cryo-ET) has been extensively studied over a long period. The calibration of projection parameters using nonlinear least squares technique methodologies stands as the ultimate and pivotal stage in the alignment procedure. The efficacy of calibration is substantially impacted by noise and outliers in the marker data obtained from previous steps. Several robust fitting methods have been explored and implemented to address this issue by improving marker data or assigning weights to markers. However, these methods have their own limitations and often assume general Gaussian noise assumption, which may not accurately represent the distribution of noise and outliers in the marker data. In this work, we propose a robust projection parameter calibration model based on <span><math><msub><mrow><mi>L</mi></mrow><mrow><mn>1</mn></mrow></msub></math></span>-norm optimization under Laplace noise assumption in order to overcome the limitations of existing methods. To efficiently solve the problem, we also design a faster and stabler first-order non-sparse method based on smooth approximation strategy. Additionally, we introduce subgradient and subdifferential for mathematical analysis. The accuracy, robustness, and efficacy of our approach are demonstrated through both simulated and real-world experiments.</div></div>\",\"PeriodicalId\":23439,\"journal\":{\"name\":\"Ultramicroscopy\",\"volume\":\"274 \",\"pages\":\"Article 114134\"},\"PeriodicalIF\":2.1000,\"publicationDate\":\"2025-04-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Ultramicroscopy\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0304399125000336\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MICROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ultramicroscopy","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0304399125000336","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MICROSCOPY","Score":null,"Total":0}
Robust projection parameter calibration in cryo-ET with L1-norm optimization
Fiducial marker-based alignment in cryo-electron tomography (cryo-ET) has been extensively studied over a long period. The calibration of projection parameters using nonlinear least squares technique methodologies stands as the ultimate and pivotal stage in the alignment procedure. The efficacy of calibration is substantially impacted by noise and outliers in the marker data obtained from previous steps. Several robust fitting methods have been explored and implemented to address this issue by improving marker data or assigning weights to markers. However, these methods have their own limitations and often assume general Gaussian noise assumption, which may not accurately represent the distribution of noise and outliers in the marker data. In this work, we propose a robust projection parameter calibration model based on -norm optimization under Laplace noise assumption in order to overcome the limitations of existing methods. To efficiently solve the problem, we also design a faster and stabler first-order non-sparse method based on smooth approximation strategy. Additionally, we introduce subgradient and subdifferential for mathematical analysis. The accuracy, robustness, and efficacy of our approach are demonstrated through both simulated and real-world experiments.
期刊介绍:
Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.