基于l1范数优化的cryo-ET鲁棒投影参数标定

IF 2.1 3区 工程技术 Q2 MICROSCOPY
Shengkai Guo , Zihe Xu , Xinyan Li , Zhidong Yang , Chenjie Feng , Renmin Han
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引用次数: 0

摘要

低温电子断层扫描(cryo-ET)中基于基准标记的定位已经被广泛研究了很长一段时间。利用非线性最小二乘技术对投影参数进行标定是标定过程中的关键环节。校正的有效性很大程度上受到从前几步获得的标记数据中的噪声和异常值的影响。通过改进标记数据或为标记分配权重,已经探索并实施了几种健壮的拟合方法来解决这个问题。然而,这些方法有其自身的局限性,通常采用一般的高斯噪声假设,可能不能准确地表示标记数据中噪声和离群值的分布。为了克服现有方法的局限性,本文提出了一种基于拉普拉斯噪声假设下l1范数优化的鲁棒投影参数校准模型。为了有效地解决这一问题,我们还设计了一种基于光滑逼近策略的更快、更稳定的一阶非稀疏方法。此外,我们还引入了次梯度和次微分来进行数学分析。我们的方法的准确性,鲁棒性和有效性通过模拟和现实世界的实验证明。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Robust projection parameter calibration in cryo-ET with L1-norm optimization
Fiducial marker-based alignment in cryo-electron tomography (cryo-ET) has been extensively studied over a long period. The calibration of projection parameters using nonlinear least squares technique methodologies stands as the ultimate and pivotal stage in the alignment procedure. The efficacy of calibration is substantially impacted by noise and outliers in the marker data obtained from previous steps. Several robust fitting methods have been explored and implemented to address this issue by improving marker data or assigning weights to markers. However, these methods have their own limitations and often assume general Gaussian noise assumption, which may not accurately represent the distribution of noise and outliers in the marker data. In this work, we propose a robust projection parameter calibration model based on L1-norm optimization under Laplace noise assumption in order to overcome the limitations of existing methods. To efficiently solve the problem, we also design a faster and stabler first-order non-sparse method based on smooth approximation strategy. Additionally, we introduce subgradient and subdifferential for mathematical analysis. The accuracy, robustness, and efficacy of our approach are demonstrated through both simulated and real-world experiments.
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来源期刊
Ultramicroscopy
Ultramicroscopy 工程技术-显微镜技术
CiteScore
4.60
自引率
13.60%
发文量
117
审稿时长
5.3 months
期刊介绍: Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
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