利用宽侧耦合楔形波导到微带线内过渡扩大MMIC封装的误差容限

IF 3.4 3区 计算机科学 Q2 COMPUTER SCIENCE, INFORMATION SYSTEMS
Hafeez-Ur-Rehman;Ha Il Song;Sean Park;Jae-Hyung Jang
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引用次数: 0

摘要

在毫米波内联波导-微带转换(WMT)中,采用了宽侧孔径耦合而不是端壁孔径耦合,在插入损耗降低0.1 dB的情况下,允许更大的垂直方向±250 um和水平方向±300 um的误差容差。此外,一个简单的楔形波导配置消除了复杂的锥形或脊波导部分的必要性。它通过消除E-plane或H-plane分裂的需要,简化了制造和测试程序。此外,该转换具有宽带和低损耗性能。分数带宽高达44%,而背靠背转换的插入损耗为8.5 dB,其中包括1米长波导的损耗(5.5 dB)。由于其低损耗、宽带宽、紧凑设计以及易于与mmic集成,该转换非常适合微波和亚毫米频率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Broadening Misalignment Tolerance Using Broadside Coupled Wedge-Waveguide to Microstrip Inline Transition for MMIC Packaging
A broadside aperture coupling was utilized instead of end-wall aperture coupling for millimeter wave inline waveguide-to-microstrip transition (WMT), allowing a larger misalignment tolerance of ±250 um in the vertical direction and ±300 um in the horizontal direction within the insertion loss degradation of 0.1 dB. Additionally, a simple wedge waveguide configuration eliminated the necessity for complex taper or ridge waveguide sections. It simplifies manufacturing and testing procedures by eliminating the need for E-plane or H-plane splits. Furthermore, the transition exhibits broadband and low-loss performance. The fractional bandwidth reached as high as 44%, while the insertion loss of the back-to-back transition was measured at 8.5 dB, which includes the loss from the 1-meter-long waveguide (5.5 dB). The transition is well-suited for microwave and sub-millimeter frequencies due to its low loss, broad bandwidth, compact design, and ease of integration with MMICs.
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来源期刊
IEEE Access
IEEE Access COMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍: IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest. IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on: Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals. Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering. Development of new or improved fabrication or manufacturing techniques. Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.
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