电子康普顿散射中的脉冲近似

IF 2.1 3区 工程技术 Q2 MICROSCOPY
BG Mendis
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引用次数: 0

摘要

通过康普顿散射测量电子结构需要满足脉冲近似。这表明非弹性碰撞时间很短,因此从原子中弹出的“次级”电子有效地摆脱了晶体势。利用动量分辨电子能量损失谱测试了脉冲近似对氮化硼和铝的鲁棒性。可靠的(相对于脉冲近似)电子结构信息获得康普顿峰值能量在~ 250 eV能量损失或更高。这些实验结果通过一个简单的二次电子穿越晶体的Kronig-Penney模型得到验证。对于松散束缚的价电子,当康普顿峰能量显著大于晶体的平均内势时,满足脉冲近似。该准则提供了从任何给定材料中提取可靠康普顿数据所需的实验条件的直接估计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On the impulse approximation in electron Compton scattering
Electronic structure measurement via Compton scattering requires the impulse approximation to be satisfied. This states that the inelastic collision time is short, so that the ‘secondary’ electron ejected out of the atom is effectively free of the crystal potential. The robustness of the impulse approximation is tested for boron nitride and aluminium using momentum-resolved electron energy loss spectroscopy. Reliable (with respect to impulse approximation) electronic structure information is obtained for Compton peak energies at ∼250 eV energy loss or higher. These experimental results are validated using a simple Kronig-Penney model of the secondary electron travelling through the crystal. For loosely bound valence electrons the impulse approximation is satisfied when the Compton peak energy is significantly larger than the mean inner potential of the crystal. This criterion provides a straightforward estimate of the experimental conditions required for extracting reliable Compton data from any given material.
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来源期刊
Ultramicroscopy
Ultramicroscopy 工程技术-显微镜技术
CiteScore
4.60
自引率
13.60%
发文量
117
审稿时长
5.3 months
期刊介绍: Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
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