Al-Tl共掺杂对ZnO薄膜光电性能的影响:实验和DFT方法

IF 4.3 3区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Anurag Kumar , Deepak Kumar Gorai , Banty Kumar , Tarun Kumar Kundu , Md Imteyaz Ahmad
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引用次数: 0

摘要

采用铊(Tl)和铝(Al)共掺杂和在5%氢气(H2)和95%氩气(Ar)气氛中辐射退火80 s的方法,提高了ZnO透明导电氧化物(TCO)薄膜的电学和光学性能。观察到溶液处理的2 at % Al和0.5 at % Tl共掺杂ZnO (TAZO)薄膜具有(002)取向的纤锌矿结构。在5% H2气氛中辐射退火导致缺陷钝化。Tl和Al共掺杂显著改善了ZnO薄膜的电子性能、结晶度、形貌、透过率、电荷迁移率和电导率。在2% al - 0.5% Tl共掺杂ZnO薄膜中,电阻率低至~ 4.6 x 10−4 Ω-cm,透明度为~ 92%。密度泛函理论(DFT)计算还表明,共掺杂Tl和Al的ZnO薄膜的迁移率和电子密度增强。Al和Tl共掺杂后,吸收系数降低,迁移率提高,有利于第二代和第三代光伏太阳能电池。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Impact of Al–Tl co-doping on the optoelectronic properties of ZnO thin film: Experimental and DFT approach

Impact of Al–Tl co-doping on the optoelectronic properties of ZnO thin film: Experimental and DFT approach
Thallium (Tl) and aluminium (Al) co-doping and radiative annealing in a 5 % hydrogen (H2) and 95 % argon (Ar) atmosphere for 80 s were utilized to enhance the electrical and optical properties of the ZnO transparent conductive oxide (TCO) thin film. It was observed that solution-processed 2 at % Al and 0.5 at % Tl co-doped ZnO (TAZO) films have wurtzite structure with (002) orientation. The radiative annealing in a 5 % H2 atmosphere results in the passivation of defects. Tl and Al co-doping significantly improves the electronic properties, crystallinity, morphology, transmittance, charge mobility, and conductivity of the ZnO thin film. A resistivity as low as ∼4.6 x 10−4 Ω-cm along with ∼92 % transparency was achieved in the 2 %Al-0.5 %Tl co-doped ZnO film. The density functional theory (DFT) calculations also showed mobility and electron density enhancement on co-doping Tl and Al in ZnO thin film. Reduced absorption coefficient and higher mobility after co-doping of Al and Tl can be beneficial for second and third-generation photovoltaic solar cells.
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来源期刊
Materials Chemistry and Physics
Materials Chemistry and Physics 工程技术-材料科学:综合
CiteScore
8.70
自引率
4.30%
发文量
1515
审稿时长
69 days
期刊介绍: Materials Chemistry and Physics is devoted to short communications, full-length research papers and feature articles on interrelationships among structure, properties, processing and performance of materials. The Editors welcome manuscripts on thin films, surface and interface science, materials degradation and reliability, metallurgy, semiconductors and optoelectronic materials, fine ceramics, magnetics, superconductors, specialty polymers, nano-materials and composite materials.
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