Jiachen Zhang , Huajiang Qin , Yuqing Wang , Geng An , Pengfa Feng , Guojun Zhang
{"title":"稀土和镍对钼薄膜高温稳定性和导电性的影响","authors":"Jiachen Zhang , Huajiang Qin , Yuqing Wang , Geng An , Pengfa Feng , Guojun Zhang","doi":"10.1016/j.scriptamat.2025.116735","DOIUrl":null,"url":null,"abstract":"<div><div>In this paper, Mo<sub>90</sub>Ta<sub>5</sub>Ni<sub>5</sub> and Mo<sub>90</sub>Ta<sub>5</sub>Re<sub>5</sub> alloy films were prepared by magnetron sputtering. The effects of annealing (500–700 °C) on their high temperature stability and electrical conductivity were studied. The results show that Re significantly improves the film properties: the resistivity of the deposited Mo-Ta-Re film (95 Ohm·nm) is 47 % lower than that of Mo-Ta-Ni. After annealing at 700 °C, the resistivity further decreases to 82 Ohm·nm due to enhanced crystallinity and inhibition of structural delamination. On the contrary, the resistivity of Ni-doped films after annealing at 700 °C increases abnormally to 210.67 Ohm·nm due to Ta selective oxidation. Density functional theory (DFT) revealed the atomic mechanism of the short-range attraction between Ta-Re and the repulsion between Ta-Ni, and clarified the electronic effects of Re-stabilized alloy structures.</div></div>","PeriodicalId":423,"journal":{"name":"Scripta Materialia","volume":"265 ","pages":"Article 116735"},"PeriodicalIF":5.3000,"publicationDate":"2025-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effects of Re and Ni on high-temperature stability and electrical conductivity in Mo thin films\",\"authors\":\"Jiachen Zhang , Huajiang Qin , Yuqing Wang , Geng An , Pengfa Feng , Guojun Zhang\",\"doi\":\"10.1016/j.scriptamat.2025.116735\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>In this paper, Mo<sub>90</sub>Ta<sub>5</sub>Ni<sub>5</sub> and Mo<sub>90</sub>Ta<sub>5</sub>Re<sub>5</sub> alloy films were prepared by magnetron sputtering. The effects of annealing (500–700 °C) on their high temperature stability and electrical conductivity were studied. The results show that Re significantly improves the film properties: the resistivity of the deposited Mo-Ta-Re film (95 Ohm·nm) is 47 % lower than that of Mo-Ta-Ni. After annealing at 700 °C, the resistivity further decreases to 82 Ohm·nm due to enhanced crystallinity and inhibition of structural delamination. On the contrary, the resistivity of Ni-doped films after annealing at 700 °C increases abnormally to 210.67 Ohm·nm due to Ta selective oxidation. Density functional theory (DFT) revealed the atomic mechanism of the short-range attraction between Ta-Re and the repulsion between Ta-Ni, and clarified the electronic effects of Re-stabilized alloy structures.</div></div>\",\"PeriodicalId\":423,\"journal\":{\"name\":\"Scripta Materialia\",\"volume\":\"265 \",\"pages\":\"Article 116735\"},\"PeriodicalIF\":5.3000,\"publicationDate\":\"2025-04-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Scripta Materialia\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1359646225001988\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Scripta Materialia","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1359646225001988","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
Effects of Re and Ni on high-temperature stability and electrical conductivity in Mo thin films
In this paper, Mo90Ta5Ni5 and Mo90Ta5Re5 alloy films were prepared by magnetron sputtering. The effects of annealing (500–700 °C) on their high temperature stability and electrical conductivity were studied. The results show that Re significantly improves the film properties: the resistivity of the deposited Mo-Ta-Re film (95 Ohm·nm) is 47 % lower than that of Mo-Ta-Ni. After annealing at 700 °C, the resistivity further decreases to 82 Ohm·nm due to enhanced crystallinity and inhibition of structural delamination. On the contrary, the resistivity of Ni-doped films after annealing at 700 °C increases abnormally to 210.67 Ohm·nm due to Ta selective oxidation. Density functional theory (DFT) revealed the atomic mechanism of the short-range attraction between Ta-Re and the repulsion between Ta-Ni, and clarified the electronic effects of Re-stabilized alloy structures.
期刊介绍:
Scripta Materialia is a LETTERS journal of Acta Materialia, providing a forum for the rapid publication of short communications on the relationship between the structure and the properties of inorganic materials. The emphasis is on originality rather than incremental research. Short reports on the development of materials with novel or substantially improved properties are also welcomed. Emphasis is on either the functional or mechanical behavior of metals, ceramics and semiconductors at all length scales.