Approaching a deuterium quantitative determination methodology in tungsten matrices

In this research, a methodology for quantifying deuterium concentrations in tungsten is approached using secondary ion mass spectrometry (SIMS), a well-stablished and effective analytical technique. Tungsten standards implanted with three distinct deuterium fluences at 600 keV were prepared using a tandetron accelerator, monitoring the ion current via a Faraday cup. In order to assess the extent of damage caused by D irradiation, the microstructure and chemical composition of the W sample with the highest fluence were examined by diffraction and microscopy techniques. The precision of deuterium quantification was validated through complementary measurements performed via nuclear reaction analysis (NRA) and magnetic sector SIMS on Si testers. A calibration curve was established by correlating signals with the implanted fluences in the tungsten standards, enabling reliable quantitative deuterium detection using SIMS technique. The approach developed is critical for understanding deuterium behavior in tungsten, a key plasma-facing material in nuclear fusion reactors, where accurate quantification is essential for evaluating material performance in terms of irradiation damage and tritium inventory management.