Designing Accelerated Degradation Tests Based on Wiener Process With a Positive Relation Between the Drift Rate and the Volatility

In this paper, we study the optimal design problem for constant-stress accelerated degradation tests using a new class of Wiener processes that effectively capture the positive relation between the drift rate and the volatility. Under the $D$-, $A$-, and $c$-optimality criteria, both the test stress levels and the allocation of test units at each stress level are explicitly determined. We provide a numerical example using carbon-film resistor data to validate our theoretical findings and perform a simulation study to highlight the advantages of our proposed designs. The numerical results suggest that the proposed designs outperform existing designs in terms of estimation accuracy.