质子束平面平行电离室制造公差对蒙特卡罗计算kQQ0因子的影响。

IF 3.3 3区 医学 Q2 ENGINEERING, BIOMEDICAL
Guillaume Houyoux, Sébastien Penninckx, Séverine Rossomme, Kevin Souris, Hugo Palmans, Nick Reynaert
{"title":"质子束平面平行电离室制造公差对蒙特卡罗计算kQQ0因子的影响。","authors":"Guillaume Houyoux, Sébastien Penninckx, Séverine Rossomme, Kevin Souris, Hugo Palmans, Nick Reynaert","doi":"10.1088/1361-6560/adc86b","DOIUrl":null,"url":null,"abstract":"<p><p><i>Objective.</i>In the recent update of the TRS-398 Code of Practice (CoP), Monte Carlo results were incorporated into the derivation of recommended beam quality correction factors for ionisation chambers (IC) in proton beams. While the underlying Monte Carlo simulations implement detailed models only based on the nominal geometries from manufacturer blueprints, this paper considers the potential geometric deviations in plane-parallel IC arising from manufacturing tolerances that can reach 10%.<i>Approach.</i>A representative model of a plane-parallel IC has been designed using the Monte Carlo code GATE/Geant4, from which beam quality correction factors have been derived. Subsequently, the results of a reference geometry are compared to those of perturbed geometries, in which the parameters are modified according to the tolerances specified in a standard.<i>Main results.</i>The comparison between the reference and perturbed geometries reveals no significant differences, as they show an agreement within one standard deviation for all the cases studied, with relative deviations not exceeding 0.5%. From these results, we estimate the maximum added uncertainty from manufacturing tolerances on Monte Carlo calculated<i>k<sub>Q</sub></i>factors to be about 0.7%.<i>Significance.</i>Overall, the current use of nominal dimensions of plane-parallel IC from manufacturer's blueprints remains consistent for beam quality correction factor calculations via Monte Carlo simulations, which therefore support the latest results recommended by the TRS-398 CoP.</p>","PeriodicalId":20185,"journal":{"name":"Physics in medicine and biology","volume":" ","pages":""},"PeriodicalIF":3.3000,"publicationDate":"2025-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Impact of manufacturing tolerances on Monte Carlo calculatedkQ,Q0factors for plane-parallel ionisation chambers in proton beams.\",\"authors\":\"Guillaume Houyoux, Sébastien Penninckx, Séverine Rossomme, Kevin Souris, Hugo Palmans, Nick Reynaert\",\"doi\":\"10.1088/1361-6560/adc86b\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p><i>Objective.</i>In the recent update of the TRS-398 Code of Practice (CoP), Monte Carlo results were incorporated into the derivation of recommended beam quality correction factors for ionisation chambers (IC) in proton beams. While the underlying Monte Carlo simulations implement detailed models only based on the nominal geometries from manufacturer blueprints, this paper considers the potential geometric deviations in plane-parallel IC arising from manufacturing tolerances that can reach 10%.<i>Approach.</i>A representative model of a plane-parallel IC has been designed using the Monte Carlo code GATE/Geant4, from which beam quality correction factors have been derived. Subsequently, the results of a reference geometry are compared to those of perturbed geometries, in which the parameters are modified according to the tolerances specified in a standard.<i>Main results.</i>The comparison between the reference and perturbed geometries reveals no significant differences, as they show an agreement within one standard deviation for all the cases studied, with relative deviations not exceeding 0.5%. From these results, we estimate the maximum added uncertainty from manufacturing tolerances on Monte Carlo calculated<i>k<sub>Q</sub></i>factors to be about 0.7%.<i>Significance.</i>Overall, the current use of nominal dimensions of plane-parallel IC from manufacturer's blueprints remains consistent for beam quality correction factor calculations via Monte Carlo simulations, which therefore support the latest results recommended by the TRS-398 CoP.</p>\",\"PeriodicalId\":20185,\"journal\":{\"name\":\"Physics in medicine and biology\",\"volume\":\" \",\"pages\":\"\"},\"PeriodicalIF\":3.3000,\"publicationDate\":\"2025-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Physics in medicine and biology\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1088/1361-6560/adc86b\",\"RegionNum\":3,\"RegionCategory\":\"医学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, BIOMEDICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Physics in medicine and biology","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1088/1361-6560/adc86b","RegionNum":3,"RegionCategory":"医学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, BIOMEDICAL","Score":null,"Total":0}
引用次数: 0

摘要

目的:在最近更新的TRS-398操作规范中,蒙特卡罗结果被纳入质子束电离室推荐光束质量校正因子的推导中。虽然底层蒙特卡罗模拟仅基于制造商蓝图中的标称几何形状实现详细模型,但本文考虑了平面平行电离室中由于制造公差可达到10%而产生的潜在几何偏差。方法:使用蒙特卡罗代码GATE/Geant4设计了一个具有代表性的平面平行电离室模型,并从中导出了光束质量校正因子。随后,将参考几何形状的结果与扰动几何形状的结果进行比较,其中参数根据标准中规定的公差进行修改。主要结果:参考和扰动几何之间的比较显示没有显着差异,因为它们在所有研究案例的一个标准偏差内显示一致,相对偏差不超过0.5%。根据这些结果,我们估计在蒙特卡罗计算的kQ因子上制造公差的最大不确定性约为0.7%。意义:总体而言,目前使用制造商蓝图中平面平行电离室的标称尺寸,通过蒙特卡罗模拟计算光束质量校正系数保持一致,因此支持TRS-398操作规范推荐的最新结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Impact of manufacturing tolerances on Monte Carlo calculatedkQ,Q0factors for plane-parallel ionisation chambers in proton beams.

Objective.In the recent update of the TRS-398 Code of Practice (CoP), Monte Carlo results were incorporated into the derivation of recommended beam quality correction factors for ionisation chambers (IC) in proton beams. While the underlying Monte Carlo simulations implement detailed models only based on the nominal geometries from manufacturer blueprints, this paper considers the potential geometric deviations in plane-parallel IC arising from manufacturing tolerances that can reach 10%.Approach.A representative model of a plane-parallel IC has been designed using the Monte Carlo code GATE/Geant4, from which beam quality correction factors have been derived. Subsequently, the results of a reference geometry are compared to those of perturbed geometries, in which the parameters are modified according to the tolerances specified in a standard.Main results.The comparison between the reference and perturbed geometries reveals no significant differences, as they show an agreement within one standard deviation for all the cases studied, with relative deviations not exceeding 0.5%. From these results, we estimate the maximum added uncertainty from manufacturing tolerances on Monte Carlo calculatedkQfactors to be about 0.7%.Significance.Overall, the current use of nominal dimensions of plane-parallel IC from manufacturer's blueprints remains consistent for beam quality correction factor calculations via Monte Carlo simulations, which therefore support the latest results recommended by the TRS-398 CoP.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Physics in medicine and biology
Physics in medicine and biology 医学-工程:生物医学
CiteScore
6.50
自引率
14.30%
发文量
409
审稿时长
2 months
期刊介绍: The development and application of theoretical, computational and experimental physics to medicine, physiology and biology. Topics covered are: therapy physics (including ionizing and non-ionizing radiation); biomedical imaging (e.g. x-ray, magnetic resonance, ultrasound, optical and nuclear imaging); image-guided interventions; image reconstruction and analysis (including kinetic modelling); artificial intelligence in biomedical physics and analysis; nanoparticles in imaging and therapy; radiobiology; radiation protection and patient dose monitoring; radiation dosimetry
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信