Study of Mn4Si7 silicide crystals obtained by hot isostatic pressing and spark plasma sintering methods in an X-ray diffractometer

In this study, the physical and structural properties of Mn₄Si₇ silicide crystals synthesized using Hot Isostatic Pressing (HIP) and Spark Plasma Sintering (SPS) methods were analyzed using X-ray diffraction (XRD) techniques. In the samples obtained by the HIP method, 11 diffraction peaks were identified, with crystal sizes ranging from 8.8∙10⁻⁹ m to 3.6∙10⁻⁸ m, and the lattice strain index varied from 0.01 to 0.41. These results reflect the microstructural characteristics and the deformation of the crystals, providing insight into how these structural features influence the mechanical, thermal, and electronic properties of the material. In the SPS method samples, 13 diffraction peaks were observed, with crystal sizes ranging from 3.8∙10⁻⁹ m to 3.6∙10⁻⁸ m, and lattice strain varied from 0.002 to 0.19, indicating that the crystals maintain structural equilibrium and geometric integrity. The dislocation density, measured in the HIP samples (ranging from 3.5∙10¹⁰ to 3.2∙10¹²) and SPS samples (ranging from 7.4∙10¹¹ to 7.9∙10¹⁴), plays a crucial role in determining the crystals' plasticity and mechanical strength. The degree of crystallinity was found to be 6.4% for the HIP method and 7% for the SPS method, reflecting the structural purity and perfection of the crystals. IR transmission spectra revealed structural changes in the crystals, demonstrating their direct influence on the material's electronic and optical properties. These analyses provide valuable insights into enhancing the thermoelectric properties and mechanical stability of materials, as well as improving the performance of technological devices under high-temperature and high-pressure conditions. This study lays the foundation for future research aimed at optimizing material properties for advanced technological applications.