High-temperature X-ray Time-lapse Imaging Based on the Improved Scintillating Performance of Na5Lu9F32:Tb3+ Glass Ceramics

Scintillating materials have advanced significantly with scientific and technological progress. However, developing scintillators capable of time-lapse imaging under extreme conditions, such as high-temperature environments, remains a formidable challenge. Herein, Tb³⁺-doped oxyfluoride glass ceramics (GCs) with exceptional scintillation performance and X-ray-induced persistent luminescence (PersL) are successfully fabricated. Remarkably, the luminescent intensities under ultraviolet and X-ray excitation are significantly enhanced by optimizing the Al₂O₃ content and inducing the precipitation of Na₅Lu₉F₃₂ nanocrystals. The integral X-ray-excited luminescence intensity reaches 219.3% of that of Bi₄Ge₃O₁₂. The GCs exhibit robust irradiation resistance even under high-power X-ray exposure. Real-time imaging based on GCs demonstrates a spatial resolution of 18 lp mm⁻¹. Furthermore, the GCs display pronounced thermally stimulated PersL following X-ray excitation, attributed to the generation of Frenkel defects. This behavior facilitates the development of a time-lapse imaging technique with high-temperature visibility after X-ray irradiation, achieving an impressive spatial resolution of 14 lp mm⁻¹, and allowing X-ray image storage for over 168 h. These findings underscore the immense potential of GC scintillators for advanced X-ray imaging applications, particularly in harsh environments.