微led革命：通过计量和检测推进技术

Q4 Engineering

Information Display Pub Date : 2025-03-12 DOI:10.1002/msid.1565

Ian Hendy, Tali Hurvitz, Noam Shapiro

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引用次数: 0

摘要

微led晶圆质量的变化，特别是波长和亮度的变化，是行业面临的主要挑战，而高通量EL测试可能是解决方案。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

The MicroLED Revolution: Advancing Technology Through Metrology and Inspection

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The MicroLED Revolution: Advancing Technology Through Metrology and Inspection

The variable quality of microLED wafers, especially in wavelength and brightness, presents a major challenge for the industry, and high-throughput EL testing could be the solution.

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来源期刊

Information Display Engineering-Electrical and Electronic Engineering

CiteScore

1.40

自引率

0.00%

发文量

期刊介绍： Information Display Magazine invites other opinions on editorials or other subjects from members of the international display community. We welcome your comments and suggestions.