人工智能数据准备情况：360 度调查

IF 23.8 1区计算机科学 Q1 COMPUTER SCIENCE, THEORY & METHODS

ACM Computing Surveys Pub Date : 2025-03-07 DOI:10.1145/3722214

Kaveen Hiniduma, Suren Byna, Jean Luca Bez

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Data Readiness for AI: A 360-Degree Survey

Artificial Intelligence (AI) applications critically depend on data. Poor quality data produces inaccurate and ineffective AI models that may lead to incorrect or unsafe use. Evaluation of data readiness is a crucial step in improving the quality and appropriateness of data usage for AI. R&D efforts have been spent on improving data quality. However, standardized metrics for evaluating data readiness for use in AI training are still evolving. In this study, we perform a comprehensive survey of metrics used to verify data readiness for AI training. This survey examines more than 140 papers published by ACM Digital Library, IEEE Xplore, journals such as Nature, Springer, and Science Direct, and online articles published by prominent AI experts. This survey aims to propose a taxonomy of data readiness for AI (DRAI) metrics for structured and unstructured datasets. We anticipate that this taxonomy will lead to new standards for DRAI metrics that would be used for enhancing the quality, accuracy, and fairness of AI training and inference.

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来源期刊

ACM Computing Surveys 工程技术-计算机：理论方法

CiteScore

33.20

自引率

0.60%

发文量

372

审稿时长

12 months

期刊介绍： ACM Computing Surveys is an academic journal that focuses on publishing surveys and tutorials on various areas of computing research and practice. The journal aims to provide comprehensive and easily understandable articles that guide readers through the literature and help them understand topics outside their specialties. In terms of impact, CSUR has a high reputation with a 2022 Impact Factor of 16.6. It is ranked 3rd out of 111 journals in the field of Computer Science Theory & Methods. ACM Computing Surveys is indexed and abstracted in various services, including AI2 Semantic Scholar, Baidu, Clarivate/ISI: JCR, CNKI, DeepDyve, DTU, EBSCO: EDS/HOST, and IET Inspec, among others.