氧化还原-剥离层状过渡金属二硫族化合物的电场致不稳定性

IF 3.2 3区 化学 Q2 CHEMISTRY, PHYSICAL
Yan D. R. Machado*, Gabriela A. Prando*, Leonardo F. Araújo, Leandro V. da Silva, Maiara O. Salles, Daniel Grasseschi, Walter Margulis, Nikolaos Chalmpes, Richard A. Vaia, Anderson S. L. Gomes and Isabel C. S. Carvalho, 
{"title":"氧化还原-剥离层状过渡金属二硫族化合物的电场致不稳定性","authors":"Yan D. R. Machado*,&nbsp;Gabriela A. Prando*,&nbsp;Leonardo F. Araújo,&nbsp;Leandro V. da Silva,&nbsp;Maiara O. Salles,&nbsp;Daniel Grasseschi,&nbsp;Walter Margulis,&nbsp;Nikolaos Chalmpes,&nbsp;Richard A. Vaia,&nbsp;Anderson S. L. Gomes and Isabel C. S. Carvalho,&nbsp;","doi":"10.1021/acs.jpcc.4c0718710.1021/acs.jpcc.4c07187","DOIUrl":null,"url":null,"abstract":"<p >Redox-exfoliated layered transition metal dichalcogenides (LTMDs) find many applications in nonlinear optics, displays, and electronics. The investigated redox LTMD suspensions in this work were characterized optically and found to be highly stable due to surface anionic polyoxometalates (POMs), which maintained the separation between sheets by Coulombic repulsion. However, exposure of the uniform suspensions of LTMDs to an electric field led to agglomeration of the TMDs into clumps of the material in a nearly transparent solvent. This was attributed to the electrochemical reduction of the surface anionic POMs. The electrochemical stability of the redox-exfoliated ACN-MoS<sub>2</sub> samples was also investigated by cyclic voltammetric measurements, which confirmed the POM reduction process. This study highlights that the stability of the LTMD/POM system can be compromised by the application of a low-intensity electric field and has bearings on its reliability in optoelectronic devices.</p>","PeriodicalId":61,"journal":{"name":"The Journal of Physical Chemistry C","volume":"129 5","pages":"2582–2589 2582–2589"},"PeriodicalIF":3.2000,"publicationDate":"2025-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://pubs.acs.org/doi/epdf/10.1021/acs.jpcc.4c07187","citationCount":"0","resultStr":"{\"title\":\"Electric-Field-Induced Instability of Redox-Exfoliated Layered Transition Metal Dichalcogenides\",\"authors\":\"Yan D. R. Machado*,&nbsp;Gabriela A. Prando*,&nbsp;Leonardo F. Araújo,&nbsp;Leandro V. da Silva,&nbsp;Maiara O. Salles,&nbsp;Daniel Grasseschi,&nbsp;Walter Margulis,&nbsp;Nikolaos Chalmpes,&nbsp;Richard A. Vaia,&nbsp;Anderson S. L. Gomes and Isabel C. S. Carvalho,&nbsp;\",\"doi\":\"10.1021/acs.jpcc.4c0718710.1021/acs.jpcc.4c07187\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p >Redox-exfoliated layered transition metal dichalcogenides (LTMDs) find many applications in nonlinear optics, displays, and electronics. The investigated redox LTMD suspensions in this work were characterized optically and found to be highly stable due to surface anionic polyoxometalates (POMs), which maintained the separation between sheets by Coulombic repulsion. However, exposure of the uniform suspensions of LTMDs to an electric field led to agglomeration of the TMDs into clumps of the material in a nearly transparent solvent. This was attributed to the electrochemical reduction of the surface anionic POMs. The electrochemical stability of the redox-exfoliated ACN-MoS<sub>2</sub> samples was also investigated by cyclic voltammetric measurements, which confirmed the POM reduction process. This study highlights that the stability of the LTMD/POM system can be compromised by the application of a low-intensity electric field and has bearings on its reliability in optoelectronic devices.</p>\",\"PeriodicalId\":61,\"journal\":{\"name\":\"The Journal of Physical Chemistry C\",\"volume\":\"129 5\",\"pages\":\"2582–2589 2582–2589\"},\"PeriodicalIF\":3.2000,\"publicationDate\":\"2025-01-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://pubs.acs.org/doi/epdf/10.1021/acs.jpcc.4c07187\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The Journal of Physical Chemistry C\",\"FirstCategoryId\":\"1\",\"ListUrlMain\":\"https://pubs.acs.org/doi/10.1021/acs.jpcc.4c07187\",\"RegionNum\":3,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"CHEMISTRY, PHYSICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Journal of Physical Chemistry C","FirstCategoryId":"1","ListUrlMain":"https://pubs.acs.org/doi/10.1021/acs.jpcc.4c07187","RegionNum":3,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
引用次数: 0

摘要

氧化还原-剥离层状过渡金属二硫化物(ltmd)在非线性光学、显示和电子学中有许多应用。本研究中所研究的氧化还原LTMD悬浮液进行了光学表征,并发现由于表面阴离子多金属氧酸盐(pom)的存在,该悬浮液在库仑排斥作用下保持了片间的分离,具有很高的稳定性。然而,将ltmd的均匀悬浮液暴露在电场中会导致tmd在几乎透明的溶剂中聚集成团块。这是由于表面阴离子聚甲醛的电化学还原。通过循环伏安法考察了氧化还原剥落后ACN-MoS2样品的电化学稳定性,证实了POM的还原过程。本研究强调了LTMD/POM系统的稳定性可能会受到低强度电场的影响,并影响其在光电器件中的可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electric-Field-Induced Instability of Redox-Exfoliated Layered Transition Metal Dichalcogenides

Redox-exfoliated layered transition metal dichalcogenides (LTMDs) find many applications in nonlinear optics, displays, and electronics. The investigated redox LTMD suspensions in this work were characterized optically and found to be highly stable due to surface anionic polyoxometalates (POMs), which maintained the separation between sheets by Coulombic repulsion. However, exposure of the uniform suspensions of LTMDs to an electric field led to agglomeration of the TMDs into clumps of the material in a nearly transparent solvent. This was attributed to the electrochemical reduction of the surface anionic POMs. The electrochemical stability of the redox-exfoliated ACN-MoS2 samples was also investigated by cyclic voltammetric measurements, which confirmed the POM reduction process. This study highlights that the stability of the LTMD/POM system can be compromised by the application of a low-intensity electric field and has bearings on its reliability in optoelectronic devices.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
The Journal of Physical Chemistry C
The Journal of Physical Chemistry C 化学-材料科学:综合
CiteScore
6.50
自引率
8.10%
发文量
2047
审稿时长
1.8 months
期刊介绍: The Journal of Physical Chemistry A/B/C is devoted to reporting new and original experimental and theoretical basic research of interest to physical chemists, biophysical chemists, and chemical physicists.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信