Jinghua Zhang;Li Liu;Olli Silvén;Matti Pietikäinen;Dewen Hu
{"title":"用于分类和物体检测的少镜头分类增量学习:调查","authors":"Jinghua Zhang;Li Liu;Olli Silvén;Matti Pietikäinen;Dewen Hu","doi":"10.1109/TPAMI.2025.3529038","DOIUrl":null,"url":null,"abstract":"Few-shot Class-Incremental Learning (FSCIL) presents a unique challenge in Machine Learning (ML), as it necessitates the Incremental Learning (IL) of new classes from sparsely labeled training samples without forgetting previous knowledge. While this field has seen recent progress, it remains an active exploration area. This paper aims to provide a comprehensive and systematic review of FSCIL. In our in-depth examination, we delve into various facets of FSCIL, encompassing the problem definition, the discussion of the primary challenges of unreliable empirical risk minimization and the stability-plasticity dilemma, general schemes, and relevant problems of IL and Few-shot Learning (FSL). Besides, we offer an overview of benchmark datasets and evaluation metrics. Furthermore, we introduce the Few-shot Class-incremental Classification (FSCIC) methods from data-based, structure-based, and optimization-based approaches and the Few-shot Class-incremental Object Detection (FSCIOD) methods from anchor-free and anchor-based approaches. Beyond these, we present several promising research directions within FSCIL that merit further investigation.","PeriodicalId":94034,"journal":{"name":"IEEE transactions on pattern analysis and machine intelligence","volume":"47 4","pages":"2924-2945"},"PeriodicalIF":0.0000,"publicationDate":"2025-01-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Few-Shot Class-Incremental Learning for Classification and Object Detection: A Survey\",\"authors\":\"Jinghua Zhang;Li Liu;Olli Silvén;Matti Pietikäinen;Dewen Hu\",\"doi\":\"10.1109/TPAMI.2025.3529038\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Few-shot Class-Incremental Learning (FSCIL) presents a unique challenge in Machine Learning (ML), as it necessitates the Incremental Learning (IL) of new classes from sparsely labeled training samples without forgetting previous knowledge. While this field has seen recent progress, it remains an active exploration area. This paper aims to provide a comprehensive and systematic review of FSCIL. In our in-depth examination, we delve into various facets of FSCIL, encompassing the problem definition, the discussion of the primary challenges of unreliable empirical risk minimization and the stability-plasticity dilemma, general schemes, and relevant problems of IL and Few-shot Learning (FSL). Besides, we offer an overview of benchmark datasets and evaluation metrics. Furthermore, we introduce the Few-shot Class-incremental Classification (FSCIC) methods from data-based, structure-based, and optimization-based approaches and the Few-shot Class-incremental Object Detection (FSCIOD) methods from anchor-free and anchor-based approaches. Beyond these, we present several promising research directions within FSCIL that merit further investigation.\",\"PeriodicalId\":94034,\"journal\":{\"name\":\"IEEE transactions on pattern analysis and machine intelligence\",\"volume\":\"47 4\",\"pages\":\"2924-2945\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2025-01-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE transactions on pattern analysis and machine intelligence\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10840313/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE transactions on pattern analysis and machine intelligence","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10840313/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Few-Shot Class-Incremental Learning for Classification and Object Detection: A Survey
Few-shot Class-Incremental Learning (FSCIL) presents a unique challenge in Machine Learning (ML), as it necessitates the Incremental Learning (IL) of new classes from sparsely labeled training samples without forgetting previous knowledge. While this field has seen recent progress, it remains an active exploration area. This paper aims to provide a comprehensive and systematic review of FSCIL. In our in-depth examination, we delve into various facets of FSCIL, encompassing the problem definition, the discussion of the primary challenges of unreliable empirical risk minimization and the stability-plasticity dilemma, general schemes, and relevant problems of IL and Few-shot Learning (FSL). Besides, we offer an overview of benchmark datasets and evaluation metrics. Furthermore, we introduce the Few-shot Class-incremental Classification (FSCIC) methods from data-based, structure-based, and optimization-based approaches and the Few-shot Class-incremental Object Detection (FSCIOD) methods from anchor-free and anchor-based approaches. Beyond these, we present several promising research directions within FSCIL that merit further investigation.