{"title":"在现代衍射仪中实现Bond方案测量小单晶单晶胞参数时样品偏心的考虑","authors":"A. L. Kudryavtsev, S. A. Gromilov","doi":"10.1134/S0022476624120102","DOIUrl":null,"url":null,"abstract":"<p>We discuss the methodological questions of measuring unit cell parameters of small crystals in Bond’s scheme on a commercial diffractometer equipped with a three-circle goniometer and a 2D detector. The effect of the sample eccentricity on the positions of X-ray diffraction reflections during rotation about φ and ω axes is examined. The approach is developed to eliminate the effect of the sample eccentricity related to rotation about the φ axis by positioning one of the crystallographic directions along the ω axis. The unit cell parameters are measured for the reference Si and Ge single crystals used in this work with relative error Δ<i>a</i>/<i>a</i> no worse than 6.5·10<sup>–5</sup>.</p>","PeriodicalId":668,"journal":{"name":"Journal of Structural Chemistry","volume":"65 12","pages":"2466 - 2477"},"PeriodicalIF":1.2000,"publicationDate":"2024-12-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Consideration of the Sample Eccentricity in the Measurement of Unit Cell Parameters of Small Single Crystals in Bond’s Scheme Implemented in Modern Diffractometers\",\"authors\":\"A. L. Kudryavtsev, S. A. Gromilov\",\"doi\":\"10.1134/S0022476624120102\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>We discuss the methodological questions of measuring unit cell parameters of small crystals in Bond’s scheme on a commercial diffractometer equipped with a three-circle goniometer and a 2D detector. The effect of the sample eccentricity on the positions of X-ray diffraction reflections during rotation about φ and ω axes is examined. The approach is developed to eliminate the effect of the sample eccentricity related to rotation about the φ axis by positioning one of the crystallographic directions along the ω axis. The unit cell parameters are measured for the reference Si and Ge single crystals used in this work with relative error Δ<i>a</i>/<i>a</i> no worse than 6.5·10<sup>–5</sup>.</p>\",\"PeriodicalId\":668,\"journal\":{\"name\":\"Journal of Structural Chemistry\",\"volume\":\"65 12\",\"pages\":\"2466 - 2477\"},\"PeriodicalIF\":1.2000,\"publicationDate\":\"2024-12-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Structural Chemistry\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://link.springer.com/article/10.1134/S0022476624120102\",\"RegionNum\":4,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"CHEMISTRY, INORGANIC & NUCLEAR\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Structural Chemistry","FirstCategoryId":"92","ListUrlMain":"https://link.springer.com/article/10.1134/S0022476624120102","RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"CHEMISTRY, INORGANIC & NUCLEAR","Score":null,"Total":0}
Consideration of the Sample Eccentricity in the Measurement of Unit Cell Parameters of Small Single Crystals in Bond’s Scheme Implemented in Modern Diffractometers
We discuss the methodological questions of measuring unit cell parameters of small crystals in Bond’s scheme on a commercial diffractometer equipped with a three-circle goniometer and a 2D detector. The effect of the sample eccentricity on the positions of X-ray diffraction reflections during rotation about φ and ω axes is examined. The approach is developed to eliminate the effect of the sample eccentricity related to rotation about the φ axis by positioning one of the crystallographic directions along the ω axis. The unit cell parameters are measured for the reference Si and Ge single crystals used in this work with relative error Δa/a no worse than 6.5·10–5.
期刊介绍:
Journal is an interdisciplinary publication covering all aspects of structural chemistry, including the theory of molecular structure and chemical bond; the use of physical methods to study the electronic and spatial structure of chemical species; structural features of liquids, solutions, surfaces, supramolecular systems, nano- and solid materials; and the crystal structure of solids.