冷冷凝惰性气体（Ne， Ar和Kr）薄膜在升华温度附近的低温TOF-SIMS。

IF 1.9 3区化学 Q3 BIOCHEMICAL RESEARCH METHODS

Journal of Mass Spectrometry Pub Date : 2024-12-22 DOI:10.1002/jms.5107

Taku T. Suzuki

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引用次数: 0

摘要

最近提出了一种可能的TOF-SIMS表面相变分析方法，用于聚合物和离子液体等有限的情况。在本研究中，我们将这种分析扩展到淬火冷凝惰性气体薄膜。新开发的低温TOF-SIMS允许测量低于4 K的TOF-SIMS，以及用于制备清洁表面的低能离子散射光谱。结果表明，当温度以恒定的斜坡速率升高时（温度程序化TOF-SIMS）， TOF-SIMS的强度变化表现出由于升华引起的急剧变化。因此，本研究证明了在（低温）TOF-SIMS入射离子束定义的局部区域分析表面相变的可能性。

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Cryogenic TOF-SIMS Around Sublimation Temperature of Quench-Condensed Noble Gas (Ne, Ar, and Kr) Films

A possible TOF-SIMS analysis of surface phase transitions has recently been proposed for limited cases such as polymers and ionic liquids. In the present study, we have extended this analysis to quench-condensed noble gas films. The newly developed cryogenic TOF-SIMS allowed both measurements of TOF-SIMS below 4 K, and low-energy ion scattering spectroscopy that is used to prepare a clean surface. It was found that the TOF-SIMS intensity variation by increasing the temperature at a constant ramp rate (temperature-programmed TOF-SIMS) shows steep changes due to sublimation. Thus, the possibility of analyzing the surface phase transition at the local region defined by the incident ion beam of (cryogenic) TOF-SIMS was demonstrated in the present study.

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来源期刊

Journal of Mass Spectrometry 化学-光谱学

CiteScore

5.10

自引率

0.00%

发文量

审稿时长

1.5 months

期刊介绍： The Journal of Mass Spectrometry publishes papers on a broad range of topics of interest to scientists working in both fundamental and applied areas involving the study of gaseous ions. The aim of JMS is to serve the scientific community with information provided and arranged to help senior investigators to better stay abreast of new discoveries and studies in their own field, to make them aware of events and developments in associated fields, and to provide students and newcomers the basic tools with which to learn fundamental and applied aspects of mass spectrometry.