Fan Wu;Kai Chen;Gen Qiu;Hao Ying;Hanmin Sheng;Yifan Wang
{"title":"基于可检测性的变流器多设备故障诊断方法","authors":"Fan Wu;Kai Chen;Gen Qiu;Hao Ying;Hanmin Sheng;Yifan Wang","doi":"10.1109/TPEL.2024.3510749","DOIUrl":null,"url":null,"abstract":"The data-driven fault diagnosis method, which eliminates the need for additional sensors while preserving the system's original structure, offers a promising approach to enhancing converter reliability. However, diagnosing multiple device faults presents significant challenges due to difficulties in fault sample acquisition, detectability uncertainty, and unexplained decisions. This article addresses these challenges by presenting a detectability-based data-driven fault diagnosis method. First, a model-based fault detectability analysis method is proposed to establish the measurement conditions necessary for reliably detecting various fault types. Utilizing these measurement condition constraints, a mechanism-enhanced neural network is designed to locate faults by fitting the changes in fault parameters. The consistency between the fitting fault parameters and the actual fault process ensures the interpretability of the diagnosis results. Additionally, by guaranteeing the identification of fault parameters, the fault circuit model assists in training, significantly reducing the number of actual fault samples required for mechanism-enhanced neural network training. Finally, experiments on a representative converter are conducted to verify the effectiveness of the proposed method. Comparisons with state-of-the-art techniques show the proposed scheme's superiority in terms of diagnostic accuracy, decision explainability, sample dependence.","PeriodicalId":13267,"journal":{"name":"IEEE Transactions on Power Electronics","volume":"40 4","pages":"5983-5998"},"PeriodicalIF":6.5000,"publicationDate":"2024-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Detectability Based Data-Driven Fault Diagnosis Method for Multiple Device Faults of Converters\",\"authors\":\"Fan Wu;Kai Chen;Gen Qiu;Hao Ying;Hanmin Sheng;Yifan Wang\",\"doi\":\"10.1109/TPEL.2024.3510749\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The data-driven fault diagnosis method, which eliminates the need for additional sensors while preserving the system's original structure, offers a promising approach to enhancing converter reliability. However, diagnosing multiple device faults presents significant challenges due to difficulties in fault sample acquisition, detectability uncertainty, and unexplained decisions. This article addresses these challenges by presenting a detectability-based data-driven fault diagnosis method. First, a model-based fault detectability analysis method is proposed to establish the measurement conditions necessary for reliably detecting various fault types. Utilizing these measurement condition constraints, a mechanism-enhanced neural network is designed to locate faults by fitting the changes in fault parameters. The consistency between the fitting fault parameters and the actual fault process ensures the interpretability of the diagnosis results. Additionally, by guaranteeing the identification of fault parameters, the fault circuit model assists in training, significantly reducing the number of actual fault samples required for mechanism-enhanced neural network training. Finally, experiments on a representative converter are conducted to verify the effectiveness of the proposed method. Comparisons with state-of-the-art techniques show the proposed scheme's superiority in terms of diagnostic accuracy, decision explainability, sample dependence.\",\"PeriodicalId\":13267,\"journal\":{\"name\":\"IEEE Transactions on Power Electronics\",\"volume\":\"40 4\",\"pages\":\"5983-5998\"},\"PeriodicalIF\":6.5000,\"publicationDate\":\"2024-12-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Power Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10777597/\",\"RegionNum\":1,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Power Electronics","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10777597/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Detectability Based Data-Driven Fault Diagnosis Method for Multiple Device Faults of Converters
The data-driven fault diagnosis method, which eliminates the need for additional sensors while preserving the system's original structure, offers a promising approach to enhancing converter reliability. However, diagnosing multiple device faults presents significant challenges due to difficulties in fault sample acquisition, detectability uncertainty, and unexplained decisions. This article addresses these challenges by presenting a detectability-based data-driven fault diagnosis method. First, a model-based fault detectability analysis method is proposed to establish the measurement conditions necessary for reliably detecting various fault types. Utilizing these measurement condition constraints, a mechanism-enhanced neural network is designed to locate faults by fitting the changes in fault parameters. The consistency between the fitting fault parameters and the actual fault process ensures the interpretability of the diagnosis results. Additionally, by guaranteeing the identification of fault parameters, the fault circuit model assists in training, significantly reducing the number of actual fault samples required for mechanism-enhanced neural network training. Finally, experiments on a representative converter are conducted to verify the effectiveness of the proposed method. Comparisons with state-of-the-art techniques show the proposed scheme's superiority in terms of diagnostic accuracy, decision explainability, sample dependence.
期刊介绍:
The IEEE Transactions on Power Electronics journal covers all issues of widespread or generic interest to engineers who work in the field of power electronics. The Journal editors will enforce standards and a review policy equivalent to the IEEE Transactions, and only papers of high technical quality will be accepted. Papers which treat new and novel device, circuit or system issues which are of generic interest to power electronics engineers are published. Papers which are not within the scope of this Journal will be forwarded to the appropriate IEEE Journal or Transactions editors. Examples of papers which would be more appropriately published in other Journals or Transactions include: 1) Papers describing semiconductor or electron device physics. These papers would be more appropriate for the IEEE Transactions on Electron Devices. 2) Papers describing applications in specific areas: e.g., industry, instrumentation, utility power systems, aerospace, industrial electronics, etc. These papers would be more appropriate for the Transactions of the Society which is concerned with these applications. 3) Papers describing magnetic materials and magnetic device physics. These papers would be more appropriate for the IEEE Transactions on Magnetics. 4) Papers on machine theory. These papers would be more appropriate for the IEEE Transactions on Power Systems. While original papers of significant technical content will comprise the major portion of the Journal, tutorial papers and papers of historical value are also reviewed for publication.