栅极开关不稳定性下 1700 V 平面栅极碳化硅 MOSFET 的劣化依赖性分析和建模

IF 6.6 1区工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Power Electronics Pub Date : 2024-11-01 DOI:10.1109/tpel.2024.3490172

Cen Chen, Zicheng Wang, Xuerong Ye, Yifan Hu, Haodong Wang, Hao Chen, Jose I. Leon

引用次数: 0

摘要

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Degradation Dependency Analysis and Modeling of 1700 V Planar-Gate SiC MOSFETs Under Gate Switching Instability

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来源期刊

IEEE Transactions on Power Electronics 工程技术-工程：电子与电气

CiteScore

15.20

自引率

20.90%

发文量

1099

审稿时长

3 months

期刊介绍： The IEEE Transactions on Power Electronics journal covers all issues of widespread or generic interest to engineers who work in the field of power electronics. The Journal editors will enforce standards and a review policy equivalent to the IEEE Transactions, and only papers of high technical quality will be accepted. Papers which treat new and novel device, circuit or system issues which are of generic interest to power electronics engineers are published. Papers which are not within the scope of this Journal will be forwarded to the appropriate IEEE Journal or Transactions editors. Examples of papers which would be more appropriately published in other Journals or Transactions include: 1) Papers describing semiconductor or electron device physics. These papers would be more appropriate for the IEEE Transactions on Electron Devices. 2) Papers describing applications in specific areas: e.g., industry, instrumentation, utility power systems, aerospace, industrial electronics, etc. These papers would be more appropriate for the Transactions of the Society which is concerned with these applications. 3) Papers describing magnetic materials and magnetic device physics. These papers would be more appropriate for the IEEE Transactions on Magnetics. 4) Papers on machine theory. These papers would be more appropriate for the IEEE Transactions on Power Systems. While original papers of significant technical content will comprise the major portion of the Journal, tutorial papers and papers of historical value are also reviewed for publication.