EMSIM+:利用生成对抗网络和迁移学习加速电磁安全评估

IF 6.3 1区 计算机科学 Q1 COMPUTER SCIENCE, THEORY & METHODS
Ya Gao;Haocheng Ma;Qizhi Zhang;Xintong Song;Yier Jin;Jiaji He;Yiqiang Zhao
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引用次数: 0

摘要

电磁侧信道分析(EM SCA)攻击对集成电路(IC)构成严重威胁,因此有必要在部署前及时检测漏洞,以提高电磁侧信道的安全性。目前已经出现了多种用于分析电磁侧信道泄漏的电磁仿真方法,并提供了足够准确的结果。然而,在高安全性芯片的设计过程中,这些基于模拟器的方法仍面临两大挑战。首先,单次安全评估需要大量测量数据,导致大量时间开销。其次,设计迭代导致重复安全评估,从而增加了评估成本。本文提出的 EMSim+ 包括两个高效、准确的布局级电磁侧信道泄漏评估框架,分别命名为 EMSim+GAN 和 EMSim+GAN+TL,以缓解上述挑战。EMSim+GAN 集成了生成对抗网络 (GAN) 模型,可利用芯片的单元电流和电网信息快速预测电磁辐射。EMSim+GAN+TL 还在框架中加入了迁移学习 (TL),利用现有设计的经验来减少新设计的训练数据集,从而达到目标精度。我们将 EMSim+ 的仿真结果与最先进的电磁仿真工具 EMSim 以及硅测量结果进行了比较。实验结果不仅证明了 EMSim+ 的高效率和高仿真精度,还验证了其在不同设计和技术节点上的通用能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
EMSim+: Accelerating Electromagnetic Security Evaluation With Generative Adversarial Network and Transfer Learning
Electromagnetic side-channel analysis (EM SCA) attack poses a serious threat to integrated circuits (ICs), necessitating timely vulnerability detection before deployment to enhance EM side-channel security. Various EM simulation methods have emerged for analyzing EM side-channel leakage, providing sufficiently accurate results. However, these simulator-based methods still face two principal challenges in the design process of high security chips. Firstly, the large volume of measurement data required for a single security evaluation results in substantial time overhead. Secondly, design iterations lead to repetitive security evaluations, thus increasing the evaluation cost. In this paper, we propose EMSim+ which includes two efficient and accurate layout-level EM side-channel leakage evaluation frameworks named EMSim+GAN and EMSim+GAN+TL to mitigate the above challenges, respectively. EMSim+GAN integrates a Generative Adversarial Network (GAN) model that utilizes the chip’s cell current and power grid information to predict EM emanations quickly. EMSim+GAN+TL further incorporates transfer learning (TL) within the framework, leveraging the experience of existing designs to reduce the training datasets for new designs and achieve the target accuracy. We compare the simulation results of EMSim+ with the state-of-the-art EM simulation tool, EMSim as well as silicon measurements. Experimental results not only prove the high efficiency and high simulation accuracy of EMSim+, but also verify its generalization ability across different designs and technology nodes.
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来源期刊
IEEE Transactions on Information Forensics and Security
IEEE Transactions on Information Forensics and Security 工程技术-工程:电子与电气
CiteScore
14.40
自引率
7.40%
发文量
234
审稿时长
6.5 months
期刊介绍: The IEEE Transactions on Information Forensics and Security covers the sciences, technologies, and applications relating to information forensics, information security, biometrics, surveillance and systems applications that incorporate these features
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