利用基于断裂力学的物理信息神经网络框架预测多缺陷材料的疲劳寿命

IF 5.7 2区 材料科学 Q1 ENGINEERING, MECHANICAL
Yingxuan Dong , Xiaofa Yang , Dongdong Chang , Qun Li
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引用次数: 0

摘要

针对传统方法(如 S-N 曲线和帕里斯定律)在评估多缺陷材料疲劳寿命方面的局限性,本研究开发了基于断裂力学的物理信息神经网络(PINN),利用循环加载(Δσ)和等效损伤面积(AD)预测多缺陷材料的寿命。多缺陷的影响通过等效损伤面积得到统一表征,等效损伤面积是根据 M-积分疲劳模型计算得出的。该模型反映了多缺陷疲劳损伤的能量演化。通过将从 M-integral 疲劳模型中获得的断裂力学先验知识嵌入 PINN 的损失函数,在训练过程中捕捉到了关键的物理信息,增强了神经网络的可解释性。通过整合 M-integral 疲劳模型在表征多缺陷材料疲劳性能方面的优势和神经网络的非线性拟合能力,所提出的方法有效提高了有限疲劳数据的泛化能力和预测精度。所提出的 PINN 模型能准确预测多缺陷材料的疲劳寿命,其平方相关系数 (R2) 超过 0.9。所提出的方法框架解决了现有多缺陷材料疲劳性能评估方法的不足以及对疲劳测试的依赖。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Predicting fatigue life of multi-defect materials using the fracture mechanics-based physics-informed neural network framework
To address the limitations of traditional methods (such as the S-N curves and Paris’s law) in evaluating the fatigue life of multi-defect materials, this study developed a fracture mechanics-based physics-informed neural network (PINN) to predict the lifetime of multi-defect materials using cyclic loading (Δσ) and the equivalent damage area (AD). Influences of multiple defects were unified characterized through the equivalent damage area, which was calculated based on the M−integral fatigue model. This model reflects the energy evolution of multi-defect fatigue damage. By embedding the prior knowledge of fracture mechanics derived from the M−integral fatigue model into the loss function of PINN, crucial physical information was captured during the training progress, enhancing the interpretability of the neural network. By integrating the advantage of the M−integral fatigue model in characterizing the fatigue performance of multi-defect materials and the nonlinear fitting ability of neural networks, the proposed approach effectively improves the generalization ability and predictive accuracy of limited fatigue data. The presented PINN models accurately forecast the fatigue life of multi-defect materials, with a squared correlation coefficient (R2) exceeding 0.9. The presented methodological framework addresses the existing gap in methods for evaluating the fatigue performance of multi-defect materials and reliance on fatigue testing.
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来源期刊
International Journal of Fatigue
International Journal of Fatigue 工程技术-材料科学:综合
CiteScore
10.70
自引率
21.70%
发文量
619
审稿时长
58 days
期刊介绍: Typical subjects discussed in International Journal of Fatigue address: Novel fatigue testing and characterization methods (new kinds of fatigue tests, critical evaluation of existing methods, in situ measurement of fatigue degradation, non-contact field measurements) Multiaxial fatigue and complex loading effects of materials and structures, exploring state-of-the-art concepts in degradation under cyclic loading Fatigue in the very high cycle regime, including failure mode transitions from surface to subsurface, effects of surface treatment, processing, and loading conditions Modeling (including degradation processes and related driving forces, multiscale/multi-resolution methods, computational hierarchical and concurrent methods for coupled component and material responses, novel methods for notch root analysis, fracture mechanics, damage mechanics, crack growth kinetics, life prediction and durability, and prediction of stochastic fatigue behavior reflecting microstructure and service conditions) Models for early stages of fatigue crack formation and growth that explicitly consider microstructure and relevant materials science aspects Understanding the influence or manufacturing and processing route on fatigue degradation, and embedding this understanding in more predictive schemes for mitigation and design against fatigue Prognosis and damage state awareness (including sensors, monitoring, methodology, interactive control, accelerated methods, data interpretation) Applications of technologies associated with fatigue and their implications for structural integrity and reliability. This includes issues related to design, operation and maintenance, i.e., life cycle engineering Smart materials and structures that can sense and mitigate fatigue degradation Fatigue of devices and structures at small scales, including effects of process route and surfaces/interfaces.
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