{"title":"在薄膜测厚中确定 Beta 发射源的实用精确技术","authors":"S. Z. Islami rad, R. Gholipour Peyvandi","doi":"10.1134/S1061830924602125","DOIUrl":null,"url":null,"abstract":"<p>The nuclear thickness gauging systems play an important role in the industry for invasive, online, and continuous measurements. The goal of the Beta thickness gauge is to obtain a precise measurement of thin films in which the performance of these gauging systems and output data quality are evaluated with the parameters including resolution, contrast, etc. The choice of the emitted suitable energy distribution of the Beta source is one of the effective factors in the system performance and precise measurement of thin films. In this research, a Beta thickness gauge with <sup>147</sup>Pm and <sup>85</sup>Kr sources was simulated and evaluated in biaxially oriented polypropylene sheet production lines in order to calculate the system performance due to Beta emitter sources with different energy distribution and select the suitable Beta emitter source. The relative error percentage, standard deviation, resolution, and contrast parameters for <sup>147</sup>Pm energy distribution were calculated 1.413, 0.113, 0.007, and 0.008, respectively. Also, these parameters for <sup>85</sup>Kr energy distribution were measured 2.750, 0.220, 0.014, and 0.001, respectively. The results reveal that the <sup>147</sup>Pm energy distribution has superior in comparison with the <sup>85</sup>Kr energy distribution for measuring of films or sheets with thin thickness.</p>","PeriodicalId":764,"journal":{"name":"Russian Journal of Nondestructive Testing","volume":null,"pages":null},"PeriodicalIF":0.9000,"publicationDate":"2024-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Practical and Precise Technique for Determination of Beta Emitter Source in Thickness Gauging of Thin Film\",\"authors\":\"S. Z. Islami rad, R. Gholipour Peyvandi\",\"doi\":\"10.1134/S1061830924602125\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>The nuclear thickness gauging systems play an important role in the industry for invasive, online, and continuous measurements. The goal of the Beta thickness gauge is to obtain a precise measurement of thin films in which the performance of these gauging systems and output data quality are evaluated with the parameters including resolution, contrast, etc. The choice of the emitted suitable energy distribution of the Beta source is one of the effective factors in the system performance and precise measurement of thin films. In this research, a Beta thickness gauge with <sup>147</sup>Pm and <sup>85</sup>Kr sources was simulated and evaluated in biaxially oriented polypropylene sheet production lines in order to calculate the system performance due to Beta emitter sources with different energy distribution and select the suitable Beta emitter source. The relative error percentage, standard deviation, resolution, and contrast parameters for <sup>147</sup>Pm energy distribution were calculated 1.413, 0.113, 0.007, and 0.008, respectively. Also, these parameters for <sup>85</sup>Kr energy distribution were measured 2.750, 0.220, 0.014, and 0.001, respectively. The results reveal that the <sup>147</sup>Pm energy distribution has superior in comparison with the <sup>85</sup>Kr energy distribution for measuring of films or sheets with thin thickness.</p>\",\"PeriodicalId\":764,\"journal\":{\"name\":\"Russian Journal of Nondestructive Testing\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.9000,\"publicationDate\":\"2024-09-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Russian Journal of Nondestructive Testing\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://link.springer.com/article/10.1134/S1061830924602125\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"MATERIALS SCIENCE, CHARACTERIZATION & TESTING\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Russian Journal of Nondestructive Testing","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1134/S1061830924602125","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"MATERIALS SCIENCE, CHARACTERIZATION & TESTING","Score":null,"Total":0}
A Practical and Precise Technique for Determination of Beta Emitter Source in Thickness Gauging of Thin Film
The nuclear thickness gauging systems play an important role in the industry for invasive, online, and continuous measurements. The goal of the Beta thickness gauge is to obtain a precise measurement of thin films in which the performance of these gauging systems and output data quality are evaluated with the parameters including resolution, contrast, etc. The choice of the emitted suitable energy distribution of the Beta source is one of the effective factors in the system performance and precise measurement of thin films. In this research, a Beta thickness gauge with 147Pm and 85Kr sources was simulated and evaluated in biaxially oriented polypropylene sheet production lines in order to calculate the system performance due to Beta emitter sources with different energy distribution and select the suitable Beta emitter source. The relative error percentage, standard deviation, resolution, and contrast parameters for 147Pm energy distribution were calculated 1.413, 0.113, 0.007, and 0.008, respectively. Also, these parameters for 85Kr energy distribution were measured 2.750, 0.220, 0.014, and 0.001, respectively. The results reveal that the 147Pm energy distribution has superior in comparison with the 85Kr energy distribution for measuring of films or sheets with thin thickness.
期刊介绍:
Russian Journal of Nondestructive Testing, a translation of Defectoskopiya, is a publication of the Russian Academy of Sciences. This publication offers current Russian research on the theory and technology of nondestructive testing of materials and components. It describes laboratory and industrial investigations of devices and instrumentation and provides reviews of new equipment developed for series manufacture. Articles cover all physical methods of nondestructive testing, including magnetic and electrical; ultrasonic; X-ray and Y-ray; capillary; liquid (color luminescence), and radio (for materials of low conductivity).