{"title":"用于电动汽车的功率半导体模块所需测试","authors":"Tobias Keller, Biwei Zhang, Edoardo Ceccarelli","doi":"10.1007/s38314-024-1911-z","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":100143,"journal":{"name":"ATZelectronics worldwide","volume":"19 10","pages":"54 - 59"},"PeriodicalIF":0.0000,"publicationDate":"2024-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Tests Required for Power Semiconductor Modules Used for E-mobility\",\"authors\":\"Tobias Keller, Biwei Zhang, Edoardo Ceccarelli\",\"doi\":\"10.1007/s38314-024-1911-z\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":100143,\"journal\":{\"name\":\"ATZelectronics worldwide\",\"volume\":\"19 10\",\"pages\":\"54 - 59\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-10-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ATZelectronics worldwide\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s38314-024-1911-z\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ATZelectronics worldwide","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1007/s38314-024-1911-z","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0