Vasyl Ryukhtin, Adél Len, László Almásy, Ewa Juszyńska-Gałązka, Wojciech Zając, Oleksandr Tomchuk
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引用次数: 0
摘要
这里介绍的是一种基于互补小角中子散射(SANS)测量的有效方法,用于对狭缝超小角中子散射(USANS)数据进行除杂,从而实现这些数据集的无缝合并。这项研究的重点是 USANS 数据的脱胶方法,然后可以用 SANS 的传统方式展示这些数据,从而实现更广泛的数据分析方法库。关键的创新之处在于使用涂抹的 SANS 数据来推断狭缝 USANS,为使用 Lake 迭代法进行涂抹提供了自洽的积分函数。通过对多孔阳极氧化铝膜的实验数据验证了所提出的方法,展示了其适用性和优势。研究结果强调了在交叉 q 区域对 USANS 和 SANS 数据进行精确去染合并的重要性,这对于复杂的散射模式尤为关键。
Pinhole small-angle neutron scattering based approach for desmearing slit ultra-small-angle neutron scattering data.
Presented here is an effective approach to desmearing slit ultra-small-angle neutron scattering (USANS) data, based on complementary small-angle neutron scattering (SANS) measurements, leading to a seamless merging of these data sets. The study focuses on the methodological aspects of desmearing USANS data, which can then be presented in the conventional manner of SANS, enabling a broader pool of data analysis methods. The key innovation lies in the use of smeared SANS data for extrapolating slit USANS, offering a self-consistent integrand function for desmearing with Lake's iterative method. The proposed approach is validated through experimental data on porous anodized aluminium oxide membranes, showcasing its applicability and benefits. The findings emphasize the importance of accurate desmearing for merging USANS and SANS data in the crossover q region, which is particularly crucial for complex scattering patterns.
期刊介绍:
Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.