Ahmad Rujhan Mohd Rais, Nurul Aqidah Mohd Sinin, Siti Nor Fazlina Abdul Hamid, Kamaruzzaman Sopian and Suhaila Sepeai
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引用次数: 0
摘要
对硅太阳能电池表面进行纹理处理可减少反射损耗,从而提高性能。通过湿化学蚀刻进行金字塔纹理处理是生产中的标准做法,而等离子蚀刻通常用于垂直孔纹理处理。相比等离子刻蚀,激光制绒提供了一种不含化学物质、使用方便的替代方法。红外(IR)透射研究表明,激光纹理样品比普通纹理样品透过 n-Si 的红外光更多,这表明激光纹理产生的垂直沟槽允许更深的光线穿透。使用横截面场发射扫描电子显微镜(FESEM)、能量色散 X 射线(EDX)和能量色散光谱(EDS)进行的分析表明了激光纹理化对纹理化 n-Si 硅片正面的影响。然而,与传统纹理电池(14.30%)相比,激光纹理表面的硅太阳能电池转换效率较低(1.20% 至 4.30%)。激光纹理电池的短路电流密度(JSC)也较低,低于 17 mA cm-2,而普通纹理电池的短路电流密度为 34.44 mA cm-2。同时,在纹理化过程中较高的激光功率(114 W)也导致了最低的短路电流密度(JSC)和开路电压(VOC),这表明激光纹理化可能会引入缺陷和位错,从而降低硅的性能。
The impact of pulsed Nd:YAG laser on the surface of n-Si and photo-electrical performance of silicon solar cells
Texturizing the surface of a silicon solar cell enhances performance by reducing reflection losses. Pyramidal texturization via wet chemical etching is standard in manufacturing, while plasma etching is often used for vertical hole texturization. Laser texturization offers a chemical-free, user-friendly alternative to plasma etching. Infrared (IR) transmission studies indicate that laser-textured samples transmit more IR light through n-Si than normally textured samples, suggesting that vertical grooves from laser texturization allow deeper light penetration. Analyses using cross-sectional Field Emission Scanning Electron Microscopy (FESEM), Energy Dispersion x-ray (EDX), and Energy Dispersive Spectroscopy (EDS) demonstrate the effects of laser texturization on the front surface of textured n-Si wafers. However, silicon solar cells with laser-textured surfaces demonstrated lower conversion efficiencies (1.20% to 4.30%) compared to conventionally textured cells (14.30%). The short-circuit current density (JSC) was also lower in laser-textured cells, below 17 mA cm−2, compared to 34.44 mA cm−2 in normally textured cells. At the same time, higher laser power (114 W) during texturization also led to the lowest JSC and open-circuit voltage (VOC), indicating that laser texturization may introduce defects and dislocations that degrade Si properties.