Maximilian Paleschke, David Huber, Friederike Wührl, Cheng-Tien Chiang, Frank O. Schumann, Jürgen Henk, Wolf Widdra
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Magnetic dichroism in darkfield UV photoemission electron microscopy
Photoemission electron microscopy (PEEM) has evolved into an indispensable
tool for structural and magnetic characterization of surfaces at the nanometer
scale. In strong contrast to synchrotron-radiation-based X-ray PEEM as a
leading method for element-specific magnetic properties via magnetic circular
dichroism (MCD), laboratory ultraviolet (UV) PEEM has seen limited application
with much smaller dichroism effects for in-plane magnetization. Here we
introduce darkfield PEEM as a novel approach to enhance MCD contrast in
threshold photoemission, enabling efficient MCD imaging with significantly
enhanced contrast by an order-of-magnitude for Fe(001). This advancement paves
the way for MCD imaging on femtosecond timescales using modern lasers. The
experimental results will be quantitatively benchmarked against advanced
relativistic photoemission calculations.
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