{"title":"简化的 EPFL GaN HEMT 模型","authors":"Farzan Jazaeri, Majid Shalchian, Ashkhen Yesayan, Amin Rassekh, Anurag Mangla, Bertrand Parvais, Jean-Michel Sallese","doi":"arxiv-2409.03589","DOIUrl":null,"url":null,"abstract":"This paper introduces a simplified and design-oriented version of the EPFL\nHEMT model [1], focusing on the normalized transconductance-to-current\ncharacteristic (Gm/ID ). Relying on these figures, insights into GaN HEMT\nmodeling in relation to technology offers a comprehensive understanding of the\ndevice behavior. Validation is achieved through measured transfer\ncharacteristics of GaN HEMTs fabricated at IMEC on a broad range of biases.\nThis simplified approach should enable a simple and effective circuit design\nmethodology with AlGaN/GaN HEMT heterostructures.","PeriodicalId":501083,"journal":{"name":"arXiv - PHYS - Applied Physics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2024-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Simplified EPFL GaN HEMT Model\",\"authors\":\"Farzan Jazaeri, Majid Shalchian, Ashkhen Yesayan, Amin Rassekh, Anurag Mangla, Bertrand Parvais, Jean-Michel Sallese\",\"doi\":\"arxiv-2409.03589\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper introduces a simplified and design-oriented version of the EPFL\\nHEMT model [1], focusing on the normalized transconductance-to-current\\ncharacteristic (Gm/ID ). Relying on these figures, insights into GaN HEMT\\nmodeling in relation to technology offers a comprehensive understanding of the\\ndevice behavior. Validation is achieved through measured transfer\\ncharacteristics of GaN HEMTs fabricated at IMEC on a broad range of biases.\\nThis simplified approach should enable a simple and effective circuit design\\nmethodology with AlGaN/GaN HEMT heterostructures.\",\"PeriodicalId\":501083,\"journal\":{\"name\":\"arXiv - PHYS - Applied Physics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-09-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"arXiv - PHYS - Applied Physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/arxiv-2409.03589\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"arXiv - PHYS - Applied Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/arxiv-2409.03589","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
本文介绍了 EPFLHEMT 模型[1]的简化和面向设计的版本,重点是归一化跨导-电流特性(Gm/ID)。根据这些数据,我们深入了解了与技术相关的 GaN HEMT 模型,从而对器件行为有了全面的认识。通过测量在 IMEC 制造的氮化镓 HEMT 在各种偏压下的传输特性,验证了这一简化方法。
This paper introduces a simplified and design-oriented version of the EPFL
HEMT model [1], focusing on the normalized transconductance-to-current
characteristic (Gm/ID ). Relying on these figures, insights into GaN HEMT
modeling in relation to technology offers a comprehensive understanding of the
device behavior. Validation is achieved through measured transfer
characteristics of GaN HEMTs fabricated at IMEC on a broad range of biases.
This simplified approach should enable a simple and effective circuit design
methodology with AlGaN/GaN HEMT heterostructures.