用于滤网表面检测的挤压-激发注意和双向特征金字塔网络

IF 1 4区 计算机科学 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Junpeng Xu, Xiangbo Zhu, Lei Shi, Jin Li, Ziman Guo
{"title":"用于滤网表面检测的挤压-激发注意和双向特征金字塔网络","authors":"Junpeng Xu, Xiangbo Zhu, Lei Shi, Jin Li, Ziman Guo","doi":"10.1117/1.jei.33.4.043044","DOIUrl":null,"url":null,"abstract":"Based on the enhanced YOLOv5, a deep learning defect detection technique is presented to deal with the problem of inadequate effectiveness in manually detecting problems on the surface of filter screens. In the last layer of the backbone network, the method combines the squeeze-and-excitation attention mechanism module, the method assigns weights to image locations based on the channel domain perspective to obtain more feature information. It also compares the results with a simple, parameter-free attention model (SimAM), which is an attention mechanism without the channel domain, and the results are higher than SimAM 0.7%. In addition, the neck network replaces the basic PANet structure with the bi-directional feature pyramid network module, which introduces multi-scale feature fusion. The experimental results show that the improved YOLOv5 algorithm has an average defect detection accuracy of 97.7% on the dataset, which is 11.3%, 12.8%, 2%, 7.8%, 5.1%, and 1.3% higher than YOLOv3, faster R-CNN, YOLOv5, SSD, YOLOv7, and YOLOv8, respectively. It can quickly and accurately identify various defects on the surface of the filter, which has an outstanding contribution to the filter manufacturing industry.","PeriodicalId":54843,"journal":{"name":"Journal of Electronic Imaging","volume":"12 1","pages":""},"PeriodicalIF":1.0000,"publicationDate":"2024-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Squeeze-and-excitation attention and bi-directional feature pyramid network for filter screens surface detection\",\"authors\":\"Junpeng Xu, Xiangbo Zhu, Lei Shi, Jin Li, Ziman Guo\",\"doi\":\"10.1117/1.jei.33.4.043044\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Based on the enhanced YOLOv5, a deep learning defect detection technique is presented to deal with the problem of inadequate effectiveness in manually detecting problems on the surface of filter screens. In the last layer of the backbone network, the method combines the squeeze-and-excitation attention mechanism module, the method assigns weights to image locations based on the channel domain perspective to obtain more feature information. It also compares the results with a simple, parameter-free attention model (SimAM), which is an attention mechanism without the channel domain, and the results are higher than SimAM 0.7%. In addition, the neck network replaces the basic PANet structure with the bi-directional feature pyramid network module, which introduces multi-scale feature fusion. The experimental results show that the improved YOLOv5 algorithm has an average defect detection accuracy of 97.7% on the dataset, which is 11.3%, 12.8%, 2%, 7.8%, 5.1%, and 1.3% higher than YOLOv3, faster R-CNN, YOLOv5, SSD, YOLOv7, and YOLOv8, respectively. It can quickly and accurately identify various defects on the surface of the filter, which has an outstanding contribution to the filter manufacturing industry.\",\"PeriodicalId\":54843,\"journal\":{\"name\":\"Journal of Electronic Imaging\",\"volume\":\"12 1\",\"pages\":\"\"},\"PeriodicalIF\":1.0000,\"publicationDate\":\"2024-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Electronic Imaging\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://doi.org/10.1117/1.jei.33.4.043044\",\"RegionNum\":4,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electronic Imaging","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1117/1.jei.33.4.043044","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

基于增强型 YOLOv5,提出了一种深度学习缺陷检测技术,以解决人工检测滤网表面问题效果不佳的问题。在骨干网络的最后一层,该方法结合了挤压-激发注意机制模块,基于通道域视角为图像位置分配权重,以获取更多特征信息。该方法还将结果与简单的无参数注意力模型(SimAM)进行了比较,后者是一种没有通道域的注意力机制,结果比 SimAM 高出 0.7%。此外,颈部网络用双向特征金字塔网络模块取代了基本的 PANet 结构,引入了多尺度特征融合。实验结果表明,改进后的 YOLOv5 算法在数据集上的平均缺陷检测准确率为 97.7%,分别比 YOLOv3、更快的 R-CNN、YOLOv5、SSD、YOLOv7 和 YOLOv8 高 11.3%、12.8%、2%、7.8%、5.1% 和 1.3%。它能快速准确地识别过滤器表面的各种缺陷,为过滤器制造业做出了突出贡献。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Squeeze-and-excitation attention and bi-directional feature pyramid network for filter screens surface detection
Based on the enhanced YOLOv5, a deep learning defect detection technique is presented to deal with the problem of inadequate effectiveness in manually detecting problems on the surface of filter screens. In the last layer of the backbone network, the method combines the squeeze-and-excitation attention mechanism module, the method assigns weights to image locations based on the channel domain perspective to obtain more feature information. It also compares the results with a simple, parameter-free attention model (SimAM), which is an attention mechanism without the channel domain, and the results are higher than SimAM 0.7%. In addition, the neck network replaces the basic PANet structure with the bi-directional feature pyramid network module, which introduces multi-scale feature fusion. The experimental results show that the improved YOLOv5 algorithm has an average defect detection accuracy of 97.7% on the dataset, which is 11.3%, 12.8%, 2%, 7.8%, 5.1%, and 1.3% higher than YOLOv3, faster R-CNN, YOLOv5, SSD, YOLOv7, and YOLOv8, respectively. It can quickly and accurately identify various defects on the surface of the filter, which has an outstanding contribution to the filter manufacturing industry.
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来源期刊
Journal of Electronic Imaging
Journal of Electronic Imaging 工程技术-成像科学与照相技术
CiteScore
1.70
自引率
27.30%
发文量
341
审稿时长
4.0 months
期刊介绍: The Journal of Electronic Imaging publishes peer-reviewed papers in all technology areas that make up the field of electronic imaging and are normally considered in the design, engineering, and applications of electronic imaging systems.
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