Daen Jannis, Wouter Van den Broek, Zezhong Zhang, Sandra Van Aert, Jo Verbeeck
{"title":"通过约束优化精细结构拟合提高电子能量损失光谱量化的精度和准确性","authors":"Daen Jannis, Wouter Van den Broek, Zezhong Zhang, Sandra Van Aert, Jo Verbeeck","doi":"arxiv-2408.11870","DOIUrl":null,"url":null,"abstract":"By working out the Bethe sum rule, a boundary condition that takes the form\nof a linear equality is derived for the fine structure observed in ionization\nedges present in electron energy-loss spectra. This condition is subsequently\nused as a constraint in the estimation process of the elemental abundances,\ndemonstrating starkly improved precision and accuracy and reduced sensitivity\nto the number of model parameters. Furthermore, the fine structure is reliably\nextracted from the spectra in an automated way, thus providing critical\ninformation on the sample's electronic properties that is hard or impossible to\nobtain otherwise. Since this approach allows dispensing with the need for\nuser-provided input, a potential source of bias is prevented.","PeriodicalId":501065,"journal":{"name":"arXiv - PHYS - Data Analysis, Statistics and Probability","volume":"15 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization\",\"authors\":\"Daen Jannis, Wouter Van den Broek, Zezhong Zhang, Sandra Van Aert, Jo Verbeeck\",\"doi\":\"arxiv-2408.11870\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"By working out the Bethe sum rule, a boundary condition that takes the form\\nof a linear equality is derived for the fine structure observed in ionization\\nedges present in electron energy-loss spectra. This condition is subsequently\\nused as a constraint in the estimation process of the elemental abundances,\\ndemonstrating starkly improved precision and accuracy and reduced sensitivity\\nto the number of model parameters. Furthermore, the fine structure is reliably\\nextracted from the spectra in an automated way, thus providing critical\\ninformation on the sample's electronic properties that is hard or impossible to\\nobtain otherwise. Since this approach allows dispensing with the need for\\nuser-provided input, a potential source of bias is prevented.\",\"PeriodicalId\":501065,\"journal\":{\"name\":\"arXiv - PHYS - Data Analysis, Statistics and Probability\",\"volume\":\"15 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-08-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"arXiv - PHYS - Data Analysis, Statistics and Probability\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/arxiv-2408.11870\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"arXiv - PHYS - Data Analysis, Statistics and Probability","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/arxiv-2408.11870","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization
By working out the Bethe sum rule, a boundary condition that takes the form
of a linear equality is derived for the fine structure observed in ionization
edges present in electron energy-loss spectra. This condition is subsequently
used as a constraint in the estimation process of the elemental abundances,
demonstrating starkly improved precision and accuracy and reduced sensitivity
to the number of model parameters. Furthermore, the fine structure is reliably
extracted from the spectra in an automated way, thus providing critical
information on the sample's electronic properties that is hard or impossible to
obtain otherwise. Since this approach allows dispensing with the need for
user-provided input, a potential source of bias is prevented.