多处理器系统的概率集群故障诊断

IF 0.9 4区 计算机科学 Q3 COMPUTER SCIENCE, THEORY & METHODS
Baohua Niu , Shuming Zhou , Hong Zhang , Qifan Zhang
{"title":"多处理器系统的概率集群故障诊断","authors":"Baohua Niu ,&nbsp;Shuming Zhou ,&nbsp;Hong Zhang ,&nbsp;Qifan Zhang","doi":"10.1016/j.tcs.2024.114837","DOIUrl":null,"url":null,"abstract":"<div><p>As high performance computing systems consisting of multiple processors play an important role in big data analytics, we are motivated to focus on the research of reliability, design-for-test, fault diagnosis and detection of large-scale multiprocessor interconnected systems. System-level diagnosis theory, which originates from the testing of VLSI and Wafer, aims to identify faulty processors in these systems by means of analyzing the test results among the processors, while diagnosability as well as diagnosis accuracy are two important indices. The probabilistic fault diagnostic strategy seeks to correctly diagnose processors with high probability under the assumption that each processor has a certain failing probability. In this work, based on the probabilistic diagnosis algorithm with consideration of fault clustering, we specialize in the local diagnostic capability to establish the probability that any processor in a discrete status is diagnosed correctly. Subsequently, we investigate the global performance evaluation of multiprocessor systems under various significant fault distributions including Poisson distribution, Exponential distribution and Binomial distribution. In addition, we directly apply our results to the data center network <span><math><mi>H</mi><mi>S</mi><mi>D</mi><mi>C</mi></math></span> and <span><math><mo>(</mo><mi>n</mi><mo>,</mo><mi>k</mi><mo>)</mo></math></span>-star network. Numerical simulations are performed to verify the established results, which reveal the relationship between the accuracy of correct diagnosis and regulatory parameters.</p></div>","PeriodicalId":49438,"journal":{"name":"Theoretical Computer Science","volume":"1020 ","pages":"Article 114837"},"PeriodicalIF":0.9000,"publicationDate":"2024-09-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Probabilistic cluster fault diagnosis for multiprocessor systems\",\"authors\":\"Baohua Niu ,&nbsp;Shuming Zhou ,&nbsp;Hong Zhang ,&nbsp;Qifan Zhang\",\"doi\":\"10.1016/j.tcs.2024.114837\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>As high performance computing systems consisting of multiple processors play an important role in big data analytics, we are motivated to focus on the research of reliability, design-for-test, fault diagnosis and detection of large-scale multiprocessor interconnected systems. System-level diagnosis theory, which originates from the testing of VLSI and Wafer, aims to identify faulty processors in these systems by means of analyzing the test results among the processors, while diagnosability as well as diagnosis accuracy are two important indices. The probabilistic fault diagnostic strategy seeks to correctly diagnose processors with high probability under the assumption that each processor has a certain failing probability. In this work, based on the probabilistic diagnosis algorithm with consideration of fault clustering, we specialize in the local diagnostic capability to establish the probability that any processor in a discrete status is diagnosed correctly. Subsequently, we investigate the global performance evaluation of multiprocessor systems under various significant fault distributions including Poisson distribution, Exponential distribution and Binomial distribution. In addition, we directly apply our results to the data center network <span><math><mi>H</mi><mi>S</mi><mi>D</mi><mi>C</mi></math></span> and <span><math><mo>(</mo><mi>n</mi><mo>,</mo><mi>k</mi><mo>)</mo></math></span>-star network. Numerical simulations are performed to verify the established results, which reveal the relationship between the accuracy of correct diagnosis and regulatory parameters.</p></div>\",\"PeriodicalId\":49438,\"journal\":{\"name\":\"Theoretical Computer Science\",\"volume\":\"1020 \",\"pages\":\"Article 114837\"},\"PeriodicalIF\":0.9000,\"publicationDate\":\"2024-09-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Theoretical Computer Science\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0304397524004547\",\"RegionNum\":4,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"COMPUTER SCIENCE, THEORY & METHODS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Theoretical Computer Science","FirstCategoryId":"94","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0304397524004547","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, THEORY & METHODS","Score":null,"Total":0}
引用次数: 0

摘要

由于由多个处理器组成的高性能计算系统在大数据分析中发挥着重要作用,我们有动力重点研究大规模多处理器互联系统的可靠性、测试设计、故障诊断和检测。系统级诊断理论源于 VLSI 和 Wafer 测试,旨在通过分析处理器之间的测试结果来识别这些系统中存在故障的处理器,而可诊断性和诊断准确性是两个重要指标。概率故障诊断策略是在假设每个处理器都有一定的故障概率的前提下,以高概率对处理器进行正确诊断。在这项工作中,基于考虑故障聚类的概率诊断算法,我们专门研究了局部诊断能力,以确定处于离散状态的任何处理器被正确诊断的概率。随后,我们研究了多处理器系统在各种重要故障分布(包括泊松分布、指数分布和二项分布)下的全局性能评估。此外,我们还将结果直接应用于数据中心网络 HSDC 和 (n,k)-star 网络。我们进行了数值模拟来验证所建立的结果,从而揭示了正确诊断的准确性与调节参数之间的关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Probabilistic cluster fault diagnosis for multiprocessor systems

As high performance computing systems consisting of multiple processors play an important role in big data analytics, we are motivated to focus on the research of reliability, design-for-test, fault diagnosis and detection of large-scale multiprocessor interconnected systems. System-level diagnosis theory, which originates from the testing of VLSI and Wafer, aims to identify faulty processors in these systems by means of analyzing the test results among the processors, while diagnosability as well as diagnosis accuracy are two important indices. The probabilistic fault diagnostic strategy seeks to correctly diagnose processors with high probability under the assumption that each processor has a certain failing probability. In this work, based on the probabilistic diagnosis algorithm with consideration of fault clustering, we specialize in the local diagnostic capability to establish the probability that any processor in a discrete status is diagnosed correctly. Subsequently, we investigate the global performance evaluation of multiprocessor systems under various significant fault distributions including Poisson distribution, Exponential distribution and Binomial distribution. In addition, we directly apply our results to the data center network HSDC and (n,k)-star network. Numerical simulations are performed to verify the established results, which reveal the relationship between the accuracy of correct diagnosis and regulatory parameters.

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来源期刊
Theoretical Computer Science
Theoretical Computer Science 工程技术-计算机:理论方法
CiteScore
2.60
自引率
18.20%
发文量
471
审稿时长
12.6 months
期刊介绍: Theoretical Computer Science is mathematical and abstract in spirit, but it derives its motivation from practical and everyday computation. Its aim is to understand the nature of computation and, as a consequence of this understanding, provide more efficient methodologies. All papers introducing or studying mathematical, logic and formal concepts and methods are welcome, provided that their motivation is clearly drawn from the field of computing.
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