对硅中的铁抑制辐照对硅二极管电气性能的影响

IF 1.1 4区物理与天体物理 Q3 NUCLEAR SCIENCE & TECHNOLOGY

Radiation Effects and Defects in Solids Pub Date : 2024-07-25 DOI:10.1080/10420150.2024.2382269

J. O. Bodunrin, S. J. Moloi

引用次数: 0

摘要

硅（Si）的辐照硬度一直是人们关注的主题，这是因为基于材料的探测器在运行期间和之后会受到损坏。在这项研究中，4MeV 质子辐照对硅的影响是非常重要的。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Suppression of irradiation effect on electrical properties of silicon diodes by iron in p-silicon

Radiation-hardness of silicon (Si) has been the subject of interest due to the damage of the material-based detectors during and after operation. In this work, the effects of 4 MeV proton-irradiati...

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Radiation Effects and Defects in Solids 物理-核科学技术

CiteScore

1.60

自引率

20.00%

发文量

107

审稿时长

4 months

期刊介绍： The Journal covers a wide range of topics under radiation and plasma sciences. The range of contributions encompasses: radiation physics; radiochemistry, radiobiology and physical effects of medical irradiation, including research on radiative cell degeneration; optical, electrical and mechanical effects of radiation, and their secondary effects such as diffusion and particle emission from surfaces; plasma techniques and plasma phenomena. On plasma science the Journal covers all areas of fusion, space and low temperature plasmas.