用于 X 射线衍射 (XRD) 的新型多帧超分辨率算法

IF 1.3 4区工程技术 Q4 CHEMISTRY, ANALYTICAL

Instrumentation Science & Technology Pub Date : 2024-06-27 DOI:10.1080/10739149.2024.2371432

X. M. Zhang, S. S. Yin, X. Zheng, F. Q. Meng, X. L. Li

引用次数: 0

摘要

X 射线衍射 (XRD) 信号的空间分布可能非常狭窄，这给通过传统方法获取高角度分辨率结果带来了挑战。本文探讨了...

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Novel multi-frame super resolution algorithm for X-ray diffraction (XRD)

The spatial distribution of signals in X-ray diffraction (XRD) may be very narrow, posing challenges in obtaining high angular resolution results through traditional methods. This article explores ...

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来源期刊

Instrumentation Science & Technology 工程技术-分析化学

CiteScore

3.50

自引率

0.00%

发文量

审稿时长

>12 weeks

期刊介绍： Instrumentation Science & Technology is an internationally acclaimed forum for fast publication of critical, peer reviewed manuscripts dealing with innovative instrument design and applications in chemistry, physics biotechnology and environmental science. Particular attention is given to state-of-the-art developments and their rapid communication to the scientific community. Emphasis is on modern instrumental concepts, though not exclusively, including detectors, sensors, data acquisition and processing, instrument control, chromatography, electrochemistry, spectroscopy of all types, electrophoresis, radiometry, relaxation methods, thermal analysis, physical property measurements, surface physics, membrane technology, microcomputer design, chip-based processes, and more. Readership includes everyone who uses instrumental techniques to conduct their research and development. They are chemists (organic, inorganic, physical, analytical, nuclear, quality control) biochemists, biotechnologists, engineers, and physicists in all of the instrumental disciplines mentioned above, in both the laboratory and chemical production environments. The journal is an important resource of instrument design and applications data.