基于毫米波干涉仪的微米级精度快速机械变形测量技术

IF 1.8 3区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Journal of Infrared, Millimeter, and Terahertz Waves Pub Date : 2024-08-05 DOI:10.1007/s10762-024-01006-8

V. V. Balandin, Vl. Vl. Balandin, D. A. Mansfeld, K. V. Mineev, V. V. Parkhachev, R. M. Rozental, A. V. Vodopyanov

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引用次数: 0

摘要

基于 Ka 波段 CW 信号发生器和高速示波器的毫米波干涉仪已经实现，这使得无需频率转换即可进行测量成为可能。对金属棒在冲击载荷作用下产生的横向变形幅度进行了实验测量。结果表明，计算数据和测量数据之间的一致性很好，证明可以测量微秒持续时间的表面偏差，精度约为 1 μm，相对误差约为 8%。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Measuring Fast Mechanical Deformation with Micrometer Precision Based on Millimeter Wave Interferometry

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Measuring Fast Mechanical Deformation with Micrometer Precision Based on Millimeter Wave Interferometry

A millimeter wave interferometer based on a Ka-band CW signal generator and a high-speed oscilloscope has been implemented, which makes it possible to carry out measurements without frequency conversion. The experimental measurements of the amplitude of transverse deformations of a metal rod caused by impact loading have been carried out. A good agreement between the calculated and measured data was revealed, demonstrating the possibility to measure microsecond-duration surface deviations with an accuracy of about 1 μm and a relative error of about 8%.

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来源期刊

Journal of Infrared, Millimeter, and Terahertz Waves 工程技术-工程：电子与电气

CiteScore

6.20

自引率

6.90%

发文量

审稿时长

3 months

期刊介绍： The Journal of Infrared, Millimeter, and Terahertz Waves offers a peer-reviewed platform for the rapid dissemination of original, high-quality research in the frequency window from 30 GHz to 30 THz. The topics covered include: sources, detectors, and other devices; systems, spectroscopy, sensing, interaction between electromagnetic waves and matter, applications, metrology, and communications. Purely numerical work, especially with commercial software packages, will be published only in very exceptional cases. The same applies to manuscripts describing only algorithms (e.g. pattern recognition algorithms). Manuscripts submitted to the Journal should discuss a significant advancement to the field of infrared, millimeter, and terahertz waves.