{"title":"从立方体材料的选区电子衍射光斑图案中确定区域轴线方向的简单方案。","authors":"Thomas E Weirich","doi":"10.1107/S1600576724004333","DOIUrl":null,"url":null,"abstract":"<p><p>Using the well known <i>R<sub>n</sub></i> ratio method, a protocol has been elaborated for determining the lattice direction for the 15 most common cubic zone axis spot patterns. The method makes use of the lengths of the three shortest reciprocal-lattice vectors in each pattern and the angles between them. No prior pattern calibration is required for the method to work, as the <i>R<sub>n</sub></i> ratio method is based entirely on geometric relationships. In the first step the pattern is assigned to one of three possible pattern types according to the angles that are measured between the three reciprocal-lattice vectors. The lattice direction [<i>uvw</i>] and possible Bravais type(s) and Laue indices of the corresponding reflections can then be determined by using lookup tables. In addition to determining the lattice direction, this simple geometric analysis allows one to distinguish between the <i>P</i>, <i>I</i> and <i>F</i> Bravais lattices for spot patterns aligned along [013], [112], [114] and [233]. Moreover, the <i>F</i> lattice can always be uniquely identified from the [011] and [123] patterns.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"57 Pt 4","pages":"1263-1269"},"PeriodicalIF":6.1000,"publicationDate":"2024-06-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11299616/pdf/","citationCount":"0","resultStr":"{\"title\":\"A simple protocol for determining the zone axis direction from selected-area electron diffraction spot patterns of cubic materials.\",\"authors\":\"Thomas E Weirich\",\"doi\":\"10.1107/S1600576724004333\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>Using the well known <i>R<sub>n</sub></i> ratio method, a protocol has been elaborated for determining the lattice direction for the 15 most common cubic zone axis spot patterns. The method makes use of the lengths of the three shortest reciprocal-lattice vectors in each pattern and the angles between them. No prior pattern calibration is required for the method to work, as the <i>R<sub>n</sub></i> ratio method is based entirely on geometric relationships. In the first step the pattern is assigned to one of three possible pattern types according to the angles that are measured between the three reciprocal-lattice vectors. The lattice direction [<i>uvw</i>] and possible Bravais type(s) and Laue indices of the corresponding reflections can then be determined by using lookup tables. In addition to determining the lattice direction, this simple geometric analysis allows one to distinguish between the <i>P</i>, <i>I</i> and <i>F</i> Bravais lattices for spot patterns aligned along [013], [112], [114] and [233]. Moreover, the <i>F</i> lattice can always be uniquely identified from the [011] and [123] patterns.</p>\",\"PeriodicalId\":14950,\"journal\":{\"name\":\"Journal of Applied Crystallography\",\"volume\":\"57 Pt 4\",\"pages\":\"1263-1269\"},\"PeriodicalIF\":6.1000,\"publicationDate\":\"2024-06-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11299616/pdf/\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Applied Crystallography\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1107/S1600576724004333\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"2024/8/1 0:00:00\",\"PubModel\":\"eCollection\",\"JCR\":\"Q1\",\"JCRName\":\"Biochemistry, Genetics and Molecular Biology\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied Crystallography","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1107/S1600576724004333","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2024/8/1 0:00:00","PubModel":"eCollection","JCR":"Q1","JCRName":"Biochemistry, Genetics and Molecular Biology","Score":null,"Total":0}
引用次数: 0
摘要
利用众所周知的 Rn 比值法,我们制定了一套方案,用于确定 15 种最常见的立方区轴光斑图案的晶格方向。该方法利用了每个图案中三个最短倒易点阵矢量的长度以及它们之间的夹角。该方法无需事先进行图案校准,因为 Rn 比值法完全基于几何关系。第一步,根据测量到的三个倒易点阵向量之间的角度,将图案分配到三种可能的图案类型之一。然后通过查找表确定晶格方向 [uvw]、可能的布拉维类型以及相应反射的 Laue 指数。除了确定晶格方向外,这种简单的几何分析还能区分沿 [013]、[112]、[114] 和 [233] 排列的光斑图案的 P、I 和 F 布拉维斯晶格。此外,从[011]和[123]图案中总能唯一地识别出 F 晶格。
A simple protocol for determining the zone axis direction from selected-area electron diffraction spot patterns of cubic materials.
Using the well known Rn ratio method, a protocol has been elaborated for determining the lattice direction for the 15 most common cubic zone axis spot patterns. The method makes use of the lengths of the three shortest reciprocal-lattice vectors in each pattern and the angles between them. No prior pattern calibration is required for the method to work, as the Rn ratio method is based entirely on geometric relationships. In the first step the pattern is assigned to one of three possible pattern types according to the angles that are measured between the three reciprocal-lattice vectors. The lattice direction [uvw] and possible Bravais type(s) and Laue indices of the corresponding reflections can then be determined by using lookup tables. In addition to determining the lattice direction, this simple geometric analysis allows one to distinguish between the P, I and F Bravais lattices for spot patterns aligned along [013], [112], [114] and [233]. Moreover, the F lattice can always be uniquely identified from the [011] and [123] patterns.
期刊介绍:
Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.