显微镜的字母汤:高级成像技术入门。第一部分:超分辨率 STED、SIM、SMI 和 SMLM

Austin Worden
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引用次数: 0

摘要

随着技术的进步,显微镜领域为科学探索提供了独特的机会。然而,用于描述这些前沿技术的复杂术语往往像字母汤一样杂乱无章。在众多缩略语中,最常见的是与超分辨率显微技术相关的一些术语,包括受激发射耗尽显微技术(STED)、结构照明显微技术(SIM)、空间调制照明技术(SMI)和单分子定位显微技术(SMLM)。这些技术突破了传统光学显微镜的限制,可实现低至数十纳米的分辨率。本文旨在解读这些常见的超分辨率技术,加深人们对显微镜的理解,并激发人们对其应用的兴趣。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The Alphabet Soup of Microscopy: An Introduction to Advanced Imaging Techniques. Part I: Super-Resolution’s STED, SIM, SMI, and SMLM
As technology advances, the field of microscopy offers unique opportunities for scientific exploration. However, the complex terminology used to describe these cutting-edge techniques often appears as a jumble of letters, akin to alphabet soup. Among the plethora of acronyms, some of the most prevalent are associated with super-resolution microscopy, including Stimulated Emission Depletion Microscopy (STED), Structured Illumination Microscopy (SIM), Spatially Modulated Illumination (SMI), and Single-Molecule Localization Microscopy (SMLM). These techniques push past the limitations of conventional light microscopy, achieving resolutions down to the tens of nanometers. This article aims to decode these common super-resolution techniques, fostering a deeper understanding of microscopy and igniting interest in their application.
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