微波频段六铁钡薄膜的特性分析

The European Physical Journal Applied Physics Pub Date : 2024-07-25 DOI:10.1051/epjap/2024240087

Didier Vincent

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引用次数: 0

摘要

微波频率下六价铁钡薄膜的表征对于通过测量磁导张量的元素来确定其电磁特性非常重要。在共面线上通过射频溅射沉积了 15 μm 的层。通过测量磁场条件下的 S 参数，提取了磁导率张量的 μ 和 κ 元素，并突出显示了它们随外加磁场的变化。正在考虑将其应用于吸收层的可能性

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Characterisation of barium hexaferrite thin films in microwave frequency band

The characterization of barium hexaferrite thin-films at microwave frequencies is important for determining their electromagnetic properties by measuring the elements of the permeability tensor. Layers of 15 μm were deposited by RF sputtering on a coplanar line. By measuring the S parameters under magnetic field conditions, the μ and κ elements of the permeability tensor were extracted and their variations as a function of the applied field were highlighted. Possible applications to absorbent layers are being considered

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The European Physical Journal Applied Physics

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