采用 4 态 CMOS-SWS 逆变器的 2 位 7T-10T SRAM 配置的综合研究与比较

Q4 Engineering
A. Husawi, R. Gudlavalleti, A. Almalki, F. Jain
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引用次数: 0

摘要

本文在之前 6T 2 位/4 态 SWSFET SRAM 设计工作的基础上,对 7T 至 10T 的 2 位 SRAM 配置中的功率耗散和传播延迟进行了全面分析。该研究将 SWSFET SRAM 的性能与基于 CMOS 的 2 态 SRAM [7] 进行了比较,突出了前者在速度和功耗方面的显著优势。利用 Cadence 模拟和模拟行为模型(ABM)和 EKV(Enz-Krummenacher-Vittoz)等模型,分析纳入了现实世界中的 0.18-[公式:见正文]m 技术考虑因素。研究利用垂直堆叠量子阱/量子点通道等独特特性,探索了使用 SWS-FET 的 7T-10T SRAM 配置在设计上的细微差别。功率耗散分析揭示了不同 SRAM 配置的不同趋势,在转换过程中电压变化明显。同样,传播延迟评估显示了不同电压转换的不同持续时间,突出了 SRAM 配置变化对效率和复杂性的影响。此外,寄生电容对于优化 SRAM 单元的性能、能效和可靠性至关重要。在这些电路中,考虑了 1[计算公式:见正文]fF的内部存储寄生电容,以便在存储单元设计过程中通过仿真分析评估其影响。研究结果有助于深入了解 SRAM 设计中的权衡问题,特别是功率耗散和传播延迟方面的问题。总之,这项研究揭示了 SWS-FET 在提高存储器电路性能方面的巨大潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Comprehensive Study and Comparison of 2-Bit 7T–10T SRAM Configurations with 4-State CMOS-SWS Inverters
This paper presents a comprehensive analysis of power dissipation and propagation delay in 2-bit SRAM configurations ranging from 7T to 10T, building upon previous work on 6T 2-bit/4-state SWSFET SRAM designs. The study compares the performance of SWSFET SRAMs with CMOS-based 2-state SRAMs [7], highlighting the former’s significant advantages in speed and power consumption. Utilizing Cadence simulations and models such as Analog Behavioral Model (ABM) and EKV (Enz–Krummenacher–Vittoz), the analysis incorporates real-world 0.18-[Formula: see text]m technology considerations. The research explores the design nuances of 7T–10T SRAM configurations using SWS-FETs, leveraging their unique characteristics like vertically stacked quantum well/quantum dot channels. Power dissipation analysis reveals varying trends across different SRAM configurations, with notable shifts in voltage changes during transitions. Similarly, propagation delay assessments showcase diverse durations for different voltage transitions, underscoring the impact of SRAM configuration changes on efficiency and complexity. In addition, parasitic capacitance is crucial for optimizing the performance, power efficiency, and reliability of SRAM cells. In these circuits an internal storage parasitic capacitance of 1[Formula: see text]fF has been considered to evaluate its effects through simulation-based analysis during the memory cell design process. The findings contribute valuable insights into the trade-offs involved in SRAM design, particularly concerning power dissipation and propagation delay, and are presented. Overall, this study sheds light on the promising potential of SWS-FETs for enhancing memory circuitry performance.
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来源期刊
International Journal of High Speed Electronics and Systems
International Journal of High Speed Electronics and Systems Engineering-Electrical and Electronic Engineering
CiteScore
0.60
自引率
0.00%
发文量
22
期刊介绍: Launched in 1990, the International Journal of High Speed Electronics and Systems (IJHSES) has served graduate students and those in R&D, managerial and marketing positions by giving state-of-the-art data, and the latest research trends. Its main charter is to promote engineering education by advancing interdisciplinary science between electronics and systems and to explore high speed technology in photonics and electronics. IJHSES, a quarterly journal, continues to feature a broad coverage of topics relating to high speed or high performance devices, circuits and systems.
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