基于改进型深度学习模型的 PCB 缺陷检测

{"title":"基于改进型深度学习模型的 PCB 缺陷检测","authors":"Shih-Hsien Tseng, Chi Kuo","doi":"10.1142/s0218001424540144","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":508211,"journal":{"name":"International Journal of Pattern Recognition and Artificial Intelligence","volume":" 45","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"PCB defect detection based on improved deep learning model\",\"authors\":\"Shih-Hsien Tseng, Chi Kuo\",\"doi\":\"10.1142/s0218001424540144\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":508211,\"journal\":{\"name\":\"International Journal of Pattern Recognition and Artificial Intelligence\",\"volume\":\" 45\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-07-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Journal of Pattern Recognition and Artificial Intelligence\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1142/s0218001424540144\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Pattern Recognition and Artificial Intelligence","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1142/s0218001424540144","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}