由 "幸运电子 "动能转移驱动的金属纳米接触点电迁移理论

Yue Tian, Guangtai Lu, Shaoqing Du, K. Kuroyama, K. Hirakawa
{"title":"由 \"幸运电子 \"动能转移驱动的金属纳米接触点电迁移理论","authors":"Yue Tian, Guangtai Lu, Shaoqing Du, K. Kuroyama, K. Hirakawa","doi":"10.35848/1882-0786/ad61ba","DOIUrl":null,"url":null,"abstract":"\n We have developed a theory for electromigration at metal nanocontacts. In the proposed theory, a metal atom is removed by kinetic energy transfer from a “lucky electron” that ballistically traverses a metal nanocontact, when the applied voltage exceeds the surface self-diffusion potential of the metal. The histogram of the critical voltage, Vc, at which metal atoms are removed, depends on the temperature as well as the probability for an atom being removed by collision with a lucky electron. The histograms of Vc for Au, Ni, Pd are well explained by the present theory.","PeriodicalId":503885,"journal":{"name":"Applied Physics Express","volume":"37 18","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Theory for electromigration at metal nanocontacts driven by kinetic energy transfer from “lucky electrons”\",\"authors\":\"Yue Tian, Guangtai Lu, Shaoqing Du, K. Kuroyama, K. Hirakawa\",\"doi\":\"10.35848/1882-0786/ad61ba\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n We have developed a theory for electromigration at metal nanocontacts. In the proposed theory, a metal atom is removed by kinetic energy transfer from a “lucky electron” that ballistically traverses a metal nanocontact, when the applied voltage exceeds the surface self-diffusion potential of the metal. The histogram of the critical voltage, Vc, at which metal atoms are removed, depends on the temperature as well as the probability for an atom being removed by collision with a lucky electron. The histograms of Vc for Au, Ni, Pd are well explained by the present theory.\",\"PeriodicalId\":503885,\"journal\":{\"name\":\"Applied Physics Express\",\"volume\":\"37 18\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Applied Physics Express\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.35848/1882-0786/ad61ba\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Physics Express","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.35848/1882-0786/ad61ba","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

我们提出了金属纳米触点电迁移理论。在提出的理论中,当施加的电压超过金属表面自扩散电位时,金属原子会通过动能转移从弹道穿越金属纳米接触的 "幸运电子 "上移除。金属原子被移除的临界电压 Vc 直方图取决于温度以及原子与幸运电子碰撞而被移除的概率。本理论可以很好地解释金、镍、钯的 Vc 直方图。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Theory for electromigration at metal nanocontacts driven by kinetic energy transfer from “lucky electrons”
We have developed a theory for electromigration at metal nanocontacts. In the proposed theory, a metal atom is removed by kinetic energy transfer from a “lucky electron” that ballistically traverses a metal nanocontact, when the applied voltage exceeds the surface self-diffusion potential of the metal. The histogram of the critical voltage, Vc, at which metal atoms are removed, depends on the temperature as well as the probability for an atom being removed by collision with a lucky electron. The histograms of Vc for Au, Ni, Pd are well explained by the present theory.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信