用于高温电容式储能的磁控溅射绝缘层涂层柔性云母薄膜

SusMat Pub Date : 2024-07-11 DOI:10.1002/sus2.228
Chao Yin, Tiandong Zhang, Changhai Zhang, Yue Zhang, Chang Kyu Jeong, Geon‐Tae Hwang, Q. Chi
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引用次数: 0

摘要

电介质电容器的高温储能性能对下一代电力电子设备至关重要。然而,传导损耗在高温下会急剧上升,从而限制了储能电容器的应用。在此,我们专门研究了由不同绝缘层磁控溅射而成的云母薄膜,它具有优异的高温储能性能。实验结果表明,PbZrO3/Al2O3/PbZrO3(PZO/AO/PZO)界面绝缘层能有效降低复合薄膜的高温漏电流和传导损耗。因此,柔性云母基复合薄膜可以同时实现超高的储能密度(Wrec)和充放电效率(η)。特别是,PZO/AO/PZO/云母/PZO/AO/PZO (PAPMPAP) 薄膜在 200°C 时具有 27.5 J/cm3 的优异 Wrec 和 87.8% 的 η,明显优于目前已报道的高温电容储能介电材料。加上出色的功率密度和电循环稳定性,这项工作中的柔性薄膜在高温储能电容器中具有巨大的应用潜力。此外,磁控溅射技术可在电容器薄膜表面沉积大面积纳米级绝缘层,为电容器的工业化生产提供技术支持。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Flexible mica films coated by magnetron sputtered insulating layers for high‐temperature capacitive energy storage
High‐temperature energy storage performance of dielectric capacitors is crucial for the next generation of power electronic devices. However, conduction losses rise sharply at elevated temperature, limiting the application of energy storage capacitors. Here, the mica films magnetron sputtered by different insulating layers are specifically investigated, which exhibit the excellent high‐temperature energy storage performance. The experimental results revealed that the PbZrO3/Al2O3/PbZrO3 (PZO/AO/PZO) interface insulating layers can effectively reduce the high‐temperature leakage current and conduction loss of the composite films. Consequently, the ultrahigh energy storage density (Wrec) and charge‒discharge efficiency (η) can be achieved simultaneously in the flexible mica‐based composite films. Especially, PZO/AO/PZO/mica/PZO/AO/PZO (PAPMPAP) films possess excellent Wrec of 27.5 J/cm3 and η of 87.8% at 200°C, which are significantly better than currently reported high‐temperature capacitive energy storage dielectric materials. Together with outstanding power density and electrical cycling stability, the flexible films in this work have great application potential in high‐temperature energy storage capacitors. Moreover, the magnetron sputtering technology can deposit large‐area nanoscale insulating layers on the surface of capacitor films, which can provide technical support for the industrial production of capacitors.
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