通过新型核心轮廓分解网络进行低对比度 X 射线图像缺陷分割

IF 8.2 1区 计算机科学 Q1 COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS
Xiaoyuan Liu , Jinhai Liu , Huanqun Zhang , Huaguang Zhang
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引用次数: 0

摘要

精确的 X 射线图像缺陷分割在工业领域至关重要,因为它是产品质量控制和生产安全的基础。深度学习(DL)已展现出强大的图像场景理解能力,并在缺陷分割任务中取得了前所未有的性能。然而,现有的深度学习方法在面对低对比度的 X 射线图像时,由于缺陷的核心信息往往被遮挡,轮廓细节模糊不清,因此性能会明显下降。为解决这一问题,本文将 X 射线缺陷分割任务明确分解为两个子任务:核心特征学习和弹性轮廓细化,从而实现任务 "串行 "分解和性能 "并行 "提升。在此基础上,本文开发了一种新型的核心轮廓分解网络(CPDNet),以实现对 X 射线图像的精确缺陷分割。具体来说,设计了核心特征学习模块,从判别和结构两个视角构建有效的特征空间,提取 X 射线图像中与缺陷相关的核心特征。随后,为了进一步提高缺陷分割性能,我们开发了弹性轮廓细化模块,首次尝试将轮廓细化定义为分布外检测,并利用弹性得分在像素级细化轮廓细节。为了全面评估所提出的方法,我们使用两个真实世界的 X 射线缺陷数据集进行了一系列实验,结果表明 CPDNet 的性能优于最先进的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low-contrast X-ray image defect segmentation via a novel core-profile decomposition network

Accurate X-ray image defect segmentation is of paramount importance in industrial contexts, as it is the foundation for product quality control and production safety. Deep learning (DL) has demonstrated powerful image scene understanding capabilities and has achieved unprecedented performance in defect segmentation tasks. However, existing DL methods suffer from significant performance degradation when facing low-contrast X-ray images, as the core information of defects is often obscured and the profile details are ambiguous. To address this issue, this paper explicitly decomposes the X-ray defect segmentation task into two subtasks: core feature learning and elasticity profile refinement, allowing task “serial” decomposition and performance “parallel” improvement. On this basis, a novel core-profile decomposition network (CPDNet) is developed to achieve accurate defect segmentation of X-ray images. Specifically, the core feature learning module is designed to construct the effective feature space from two views, discriminative and structural, to extract defect-related core features from X-ray images. Subsequently, the elasticity profile refinement module is developed to further improve the defect segmentation performance, which makes the first attempt to define the profile refinement as an out-of-distribution detection and leverage the elasticity score to refine the profile details at the pixel level. To fully evaluate the presented method, we conduct a series of experiments using two real-world X-ray defect datasets, and the results demonstrate that the CPDNet outperforms state-of-the-art methods.

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来源期刊
Computers in Industry
Computers in Industry 工程技术-计算机:跨学科应用
CiteScore
18.90
自引率
8.00%
发文量
152
审稿时长
22 days
期刊介绍: The objective of Computers in Industry is to present original, high-quality, application-oriented research papers that: • Illuminate emerging trends and possibilities in the utilization of Information and Communication Technology in industry; • Establish connections or integrations across various technology domains within the expansive realm of computer applications for industry; • Foster connections or integrations across diverse application areas of ICT in industry.
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