Tin Barisin, Jesus Angulo, Katja Schladitz, Claudia Redenbach
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Riesz Feature Representation: Scale Equivariant Scattering Network for Classification Tasks
SIAM Journal on Imaging Sciences, Volume 17, Issue 2, Page 1284-1313, June 2024. Abstract. Scattering networks yield powerful and robust hierarchical image descriptors which do not require lengthy training and which work well with very few training data. However, they rely on sampling the scale dimension. Hence, they become sensitive to scale variations and are unable to generalize to unseen scales. In this work, we define an alternative feature representation based on the Riesz transform. We detail and analyze the mathematical foundations behind this representation. In particular, it inherits scale equivariance from the Riesz transform and completely avoids sampling of the scale dimension. Additionally, the number of features in the representation is reduced by a factor four compared to scattering networks. Nevertheless, our representation performs comparably well for texture classification with an interesting addition: scale equivariance. Our method yields very good performance when dealing with scales outside of those covered by the training dataset. The usefulness of the equivariance property is demonstrated on the digit classification task, where accuracy remains stable even for scales four times larger than the one chosen for training. As a second example, we consider classification of textures. Finally, we show how this representation can be used to build hybrid deep learning methods that are more stable to scale variations than standard deep networks.
期刊介绍:
SIAM Journal on Imaging Sciences (SIIMS) covers all areas of imaging sciences, broadly interpreted. It includes image formation, image processing, image analysis, image interpretation and understanding, imaging-related machine learning, and inverse problems in imaging; leading to applications to diverse areas in science, medicine, engineering, and other fields. The journal’s scope is meant to be broad enough to include areas now organized under the terms image processing, image analysis, computer graphics, computer vision, visual machine learning, and visualization. Formal approaches, at the level of mathematics and/or computations, as well as state-of-the-art practical results, are expected from manuscripts published in SIIMS. SIIMS is mathematically and computationally based, and offers a unique forum to highlight the commonality of methodology, models, and algorithms among diverse application areas of imaging sciences. SIIMS provides a broad authoritative source for fundamental results in imaging sciences, with a unique combination of mathematics and applications.
SIIMS covers a broad range of areas, including but not limited to image formation, image processing, image analysis, computer graphics, computer vision, visualization, image understanding, pattern analysis, machine intelligence, remote sensing, geoscience, signal processing, medical and biomedical imaging, and seismic imaging. The fundamental mathematical theories addressing imaging problems covered by SIIMS include, but are not limited to, harmonic analysis, partial differential equations, differential geometry, numerical analysis, information theory, learning, optimization, statistics, and probability. Research papers that innovate both in the fundamentals and in the applications are especially welcome. SIIMS focuses on conceptually new ideas, methods, and fundamentals as applied to all aspects of imaging sciences.