{"title":"利用相场后处理技术增强 X 射线衍射显微镜的多晶微结构重建能力","authors":"Marcel Chlupsa , Zachary Croft , Katsuyo Thornton , Ashwin J. Shahani","doi":"10.1016/j.scriptamat.2024.116228","DOIUrl":null,"url":null,"abstract":"<div><p>A novel protocol utilizing a phase-field model was used to process the reconstruction of a polycrystalline microstructure from synchrotron-based high-energy X-ray diffraction microscopy. This approach is an intuitive and standardized alternative to typical image processing routines. It preserves high-confidence regions by deploying a completeness-based mobility parameter in the phase-field model. Phase-field governing equations result in a space-filling grain map that adheres to the physics of the microstructure, <em>i.e.</em>, it penalizes high-energy grain shapes and configurations and promotes grain boundary (GB) smoothing. We quantify GB smoothing by measuring, in 2D, the circularity of interior grains and the tortuosity of individual GBs. Results are also presented in 3D. This post-processing protocol can be applied to any X-ray diffraction microscopy reconstruction that consists of a spatial map of grains and corresponding confidence values. Furthermore, it can be adapted to accommodate other types of microstructures, including those that are polyphase.</p></div>","PeriodicalId":423,"journal":{"name":"Scripta Materialia","volume":null,"pages":null},"PeriodicalIF":5.3000,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Enhancing polycrystalline-microstructure reconstruction from X-ray diffraction microscopy with phase-field post-processing\",\"authors\":\"Marcel Chlupsa , Zachary Croft , Katsuyo Thornton , Ashwin J. Shahani\",\"doi\":\"10.1016/j.scriptamat.2024.116228\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>A novel protocol utilizing a phase-field model was used to process the reconstruction of a polycrystalline microstructure from synchrotron-based high-energy X-ray diffraction microscopy. This approach is an intuitive and standardized alternative to typical image processing routines. It preserves high-confidence regions by deploying a completeness-based mobility parameter in the phase-field model. Phase-field governing equations result in a space-filling grain map that adheres to the physics of the microstructure, <em>i.e.</em>, it penalizes high-energy grain shapes and configurations and promotes grain boundary (GB) smoothing. We quantify GB smoothing by measuring, in 2D, the circularity of interior grains and the tortuosity of individual GBs. Results are also presented in 3D. This post-processing protocol can be applied to any X-ray diffraction microscopy reconstruction that consists of a spatial map of grains and corresponding confidence values. Furthermore, it can be adapted to accommodate other types of microstructures, including those that are polyphase.</p></div>\",\"PeriodicalId\":423,\"journal\":{\"name\":\"Scripta Materialia\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":5.3000,\"publicationDate\":\"2024-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Scripta Materialia\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S135964622400263X\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Scripta Materialia","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S135964622400263X","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
摘要
利用相场模型的新方案,对同步辐射高能 X 射线衍射显微镜重建的多晶体微观结构进行了处理。这种方法是典型图像处理程序的直观和标准化替代方案。它通过在相场模型中部署基于完备性的流动参数来保留高置信度区域。相场控制方程产生的空间填充晶粒图符合微观结构的物理学原理,即它惩罚高能晶粒形状和配置,促进晶粒边界(GB)平滑化。我们通过二维测量内部晶粒的圆度和单个 GB 的曲折度来量化 GB 平滑。结果也以三维形式呈现。该后处理方案可应用于任何由晶粒空间图和相应置信度值组成的 X 射线衍射显微镜重建。此外,它还可适用于其他类型的微结构,包括多相微结构。
Enhancing polycrystalline-microstructure reconstruction from X-ray diffraction microscopy with phase-field post-processing
A novel protocol utilizing a phase-field model was used to process the reconstruction of a polycrystalline microstructure from synchrotron-based high-energy X-ray diffraction microscopy. This approach is an intuitive and standardized alternative to typical image processing routines. It preserves high-confidence regions by deploying a completeness-based mobility parameter in the phase-field model. Phase-field governing equations result in a space-filling grain map that adheres to the physics of the microstructure, i.e., it penalizes high-energy grain shapes and configurations and promotes grain boundary (GB) smoothing. We quantify GB smoothing by measuring, in 2D, the circularity of interior grains and the tortuosity of individual GBs. Results are also presented in 3D. This post-processing protocol can be applied to any X-ray diffraction microscopy reconstruction that consists of a spatial map of grains and corresponding confidence values. Furthermore, it can be adapted to accommodate other types of microstructures, including those that are polyphase.
期刊介绍:
Scripta Materialia is a LETTERS journal of Acta Materialia, providing a forum for the rapid publication of short communications on the relationship between the structure and the properties of inorganic materials. The emphasis is on originality rather than incremental research. Short reports on the development of materials with novel or substantially improved properties are also welcomed. Emphasis is on either the functional or mechanical behavior of metals, ceramics and semiconductors at all length scales.