Elnaz Vakili, G. Karimian, M. Shoaran, Reza Yadipour, J. Sobhi
{"title":"Valid-IoU: 基于 IoU 的改进损失函数及其在印刷电路板缺陷检测中的应用","authors":"Elnaz Vakili, G. Karimian, M. Shoaran, Reza Yadipour, J. Sobhi","doi":"10.1007/s11042-024-19482-4","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":506090,"journal":{"name":"Multimedia Tools and Applications","volume":"60 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Valid-IoU: an improved IoU-based loss function and its application to detection of defects on printed circuit boards\",\"authors\":\"Elnaz Vakili, G. Karimian, M. Shoaran, Reza Yadipour, J. Sobhi\",\"doi\":\"10.1007/s11042-024-19482-4\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":506090,\"journal\":{\"name\":\"Multimedia Tools and Applications\",\"volume\":\"60 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Multimedia Tools and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/s11042-024-19482-4\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Multimedia Tools and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s11042-024-19482-4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}