用于 CMS 漂移管升级的探测器上电子设备的辐射硬度和质量验证

M. Bellato, A. Bergnoli, A. Griggio, M. Toffano, A. Triossi
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引用次数: 0

摘要

鉴于高亮度大型强子对撞机的升级,即所谓的第二阶段升级,CMS 的漂移管(DT)子探测器的电子设备将进行全面革新。对触发率的要求将超出现有电子设备的能力。因此,需要更换所有探测器上的电子设备和相关的后端设备。第二阶段的漂移管探测器电子设备包括约 800 块基于 FPGA(现场可编程门阵列)的电路板,称为 OBDT(漂移管探测器电路板)。这些电路板又分为两个不同的类别:600 个 OBDT ϕ 和 200 个 OBDT θ,分别用于读出与大型强子对撞机光束平行和法线方向的漂移管线。每个 OBDT ϕ 能够以亚纳秒级的分辨率对 240 个通道进行时间数字化,并通过运行速度为 10.24 Gb/s 的多个高速光链路上传到后端。在设计 OBDT 时,必须选择具有良好抗辐射性能的元件。主要组件 FPGA 是 Microsemi 公司生产的基于闪存的 PolarFire,已经在不同的设施中通过了辐射硬度测试。作为验证步骤,在意大利特伦托的 INFN-TIFPA 质子治疗中心使用质子束进行了辐射测试。评估了 OBDT φ 板在辐照期间的表现,辐照总剂量远高于 HL-LHC 10 年期间的预期综合剂量(0.5 Gy)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Radiation hardness and quality validation of the on-detector electronics for the CMS Drift Tubes upgrade
In view of the High Luminosity LHC upgrade, the so-called Phase 2 upgrade, the electronics of the Drift Tubes (DT) subdetector of CMS will undergo a complete innovation. The requirements in terms of trigger rate will exceed the capabilities of the present electronics. Thus, all the on-detector electronics together with the associated back-end need to be replaced. Phase-2 on-detector electronics for DT consist of about 800 FPGAs (Field Programmable Gate Array) based boards called OBDT (On-detector Board for Drift Tubes). These boards are sub-divided in two different categories: 600 OBDT ϕ and 200 OBDT θ, targeting respectively the readout of DT wires parallel and normal to the LHC beams. Each OBDT ϕ is able to time-digitize 240 channels with sub-nanosecond resolution and upstream to the back end using multiple high-speed optical links running at 10.24 Gb/s. The choice of components known to have good resistance to radiation was a requirement in the design of the OBDT. The main component, the FPGA, is a flash-based PolarFire from Microsemi, already qualified in different facilities for radiation hardness tests. As a validation step, a campaign of radiation tests was carried out at the INFN-TIFPA Protontherapy Centre in Trento, Italy, using proton beams. The behavior of an OBDT  ϕ board was evaluated during radiation exposure with a total dose much higher than expected to be integrated during 10 years of HL-LHC, which is 0.5 Gy.
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